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Title: Derivation of the shear compliance of thin films on quartz resonators from comparison of the frequency shifts on different harmonics: A perturbation analysis

Abstract

Viscoelastic effects contribute to the shift in resonance frequency of quartz crystal resonators induced by deposition of thin films on the resonator surface. In turn, the mechanical stiffness of the film can be experimentally determined from a comparison of the resonance shifts on different harmonics. When the film is much thinner than the wavelength of shear sound, a series expansion of the viscoelastic effects to third order in film thickness leads to rather simple equations. When plotting the normalized frequency shift {delta}f/f versus the square of the overtone order n{sup 2} one finds a linear relationship, where the slope is determined by the film{close_quote}s elastic compliance. When the same analysis is carried out on the resonance bandwidths rather than the frequency shifts the viscous compliance is obtained. The effects of asymmetric coatings, electrodes, and liquid media are discussed. {copyright} 2001 American Institute of Physics.

Authors:
Publication Date:
Sponsoring Org.:
(US)
OSTI Identifier:
40203767
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 89; Journal Issue: 11; Other Information: DOI: 10.1063/1.1358317; Othernumber: JAPIAU000089000011006356000001; 028109JAP; PBD: 1 Jun 2001; Journal ID: ISSN 0021-8979
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; COMPLIANCE; HARMONICS; QUARTZ; RESONATORS; SERIES EXPANSION; SHEAR; THIN FILMS

Citation Formats

Johannsmann, Diethelm. Derivation of the shear compliance of thin films on quartz resonators from comparison of the frequency shifts on different harmonics: A perturbation analysis. United States: N. p., 2001. Web. doi:10.1063/1.1358317.
Johannsmann, Diethelm. Derivation of the shear compliance of thin films on quartz resonators from comparison of the frequency shifts on different harmonics: A perturbation analysis. United States. doi:10.1063/1.1358317.
Johannsmann, Diethelm. Fri . "Derivation of the shear compliance of thin films on quartz resonators from comparison of the frequency shifts on different harmonics: A perturbation analysis". United States. doi:10.1063/1.1358317.
@article{osti_40203767,
title = {Derivation of the shear compliance of thin films on quartz resonators from comparison of the frequency shifts on different harmonics: A perturbation analysis},
author = {Johannsmann, Diethelm},
abstractNote = {Viscoelastic effects contribute to the shift in resonance frequency of quartz crystal resonators induced by deposition of thin films on the resonator surface. In turn, the mechanical stiffness of the film can be experimentally determined from a comparison of the resonance shifts on different harmonics. When the film is much thinner than the wavelength of shear sound, a series expansion of the viscoelastic effects to third order in film thickness leads to rather simple equations. When plotting the normalized frequency shift {delta}f/f versus the square of the overtone order n{sup 2} one finds a linear relationship, where the slope is determined by the film{close_quote}s elastic compliance. When the same analysis is carried out on the resonance bandwidths rather than the frequency shifts the viscous compliance is obtained. The effects of asymmetric coatings, electrodes, and liquid media are discussed. {copyright} 2001 American Institute of Physics.},
doi = {10.1063/1.1358317},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 11,
volume = 89,
place = {United States},
year = {2001},
month = {6}
}