Optical studies of the smectic-C{sub {alpha}}{sup *} phase layer structure in free-standing films

Journal Article · Fri Jun 01 00:00:00 EDT 2001 · Physical Review E

DOI:https://doi.org/10.1103/PhysRevE.63.061711· OSTI ID:40203384

Olson, D A; Pankratz, S; Johnson, P M; Cady, A; Nguyen, H T; Huang, C C

The layer structure of the smectic-C{sub {alpha}}{sup *} phase of one liquid-crystal compound has been acquired from both differential optical reflectivity and ellipsometry measurements in the free-standing film geometry. The data from both techniques display characteristic oscillations as a function of temperature, which can be described by a model for the film consisting of surface anticlinic layers and an interior short-pitched azimuthal helix. These results are consistent with those found previously for another compound. Depolarized reflected light microscopy is used to study the films when the unique features of the aforementioned oscillations occur.

• Sponsoring Organization: (US)
• OSTI ID: 40203384
• Journal Information: Physical Review E, Vol. 63, Issue 6; Other Information: DOI: 10.1103/PhysRevE.63.061711; Othernumber: PLEEE8000063000006061711000001; 104106PRE; PBD: Jun 2001; ISSN 1063-651X
• Publisher: The American Physical Society
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELLIPSOMETRY
GEOMETRY
MICROSCOPY
OSCILLATIONS
REFLECTIVITY