Recent progress in AlGaN/GaN based optoelectronic devices
Book
·
OSTI ID:395047
- APA Optics, Inc., Blaine, MN (United States)
- Univ. of Virginia, Charlottesville, VA (United States). Dept. of Electrical Engineering
The authors review the recent results on GaN based optoelectronic devices, which include InGaN-AlGaN Light Emitting Diodes (LEDs), GaN photoconductive, Schottky barrier, and p-n junction ultraviolet detectors, and optoelectronic AlGaN-GaN Heterostructure Field Effect Transistors. GaN-based optoelectronic devices cover a wide spectral range and demonstrate visible blind operation. A high quality of the epitaxial layers, the recent development of high performance GaN-based heterostructure field effect transistors, and transparent substrates make this material system uniquely suited for optoelectronic integrated circuits operating in visible and ultraviolet range.
- OSTI ID:
- 395047
- Report Number(s):
- CONF-951155-; ISBN 1-55899-298-7; TRN: IM9648%%124
- Resource Relation:
- Conference: Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 27 Nov - 1 Dec 1995; Other Information: PBD: 1996; Related Information: Is Part Of Gallium nitride and related materials; Ponce, F.A. [ed.] [Xerox Palo Alto Research Center, CA (United States)]; Dupuis, R.D. [ed.] [Univ. of Texas, Austin, TX (United States)]; Nakamura, S. [ed.] [Nichia Chemical Industries, Tokushima (Japan)]; Edmond, J.A. [ed.] [Cree Research, Inc., Durham, NC (United States)]; PB: 993 p.; Materials Research Society symposium proceedings, Volume 395
- Country of Publication:
- United States
- Language:
- English
Similar Records
Degradation of blue AlGaN/InGaN/GaN LEDs subjected to high current pulses
Electroreflectance spectra of InGaN/AlGaN/GaN quantum-well heterostructures
Comparison of trap characteristics between AlGaN/GaN and AlGaN/InGaN/GaN heterostructure by frequency dependent conductance measurement
Conference
·
Sat Dec 31 00:00:00 EST 1994
·
OSTI ID:395047
+5 more
Electroreflectance spectra of InGaN/AlGaN/GaN quantum-well heterostructures
Journal Article
·
Sat Sep 15 00:00:00 EDT 2007
· Semiconductors
·
OSTI ID:395047
+6 more
Comparison of trap characteristics between AlGaN/GaN and AlGaN/InGaN/GaN heterostructure by frequency dependent conductance measurement
Journal Article
·
Mon Feb 23 00:00:00 EST 2015
· Applied Physics Letters
·
OSTI ID:395047
Related Subjects
36 MATERIALS SCIENCE
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES
COMPOSITE MATERIALS
CHEMICAL VAPOR DEPOSITION
GALLIUM NITRIDES
INDIUM NITRIDES
ALUMINIUM NITRIDES
ELECTRONIC EQUIPMENT
FABRICATION
PERFORMANCE
SUBSTRATES
SAPPHIRE
ORGANOMETALLIC COMPOUNDS
AMMONIA
DOPED MATERIALS
ELECTRICAL PROPERTIES
OPTICAL PROPERTIES
LIGHT EMITTING DIODES
TRANSISTORS
ULTRAVIOLET SPECTRA
EXPERIMENTAL DATA
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES
COMPOSITE MATERIALS
CHEMICAL VAPOR DEPOSITION
GALLIUM NITRIDES
INDIUM NITRIDES
ALUMINIUM NITRIDES
ELECTRONIC EQUIPMENT
FABRICATION
PERFORMANCE
SUBSTRATES
SAPPHIRE
ORGANOMETALLIC COMPOUNDS
AMMONIA
DOPED MATERIALS
ELECTRICAL PROPERTIES
OPTICAL PROPERTIES
LIGHT EMITTING DIODES
TRANSISTORS
ULTRAVIOLET SPECTRA
EXPERIMENTAL DATA