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Title: Epitaxial growth and structure of cubic and pseudocubic perovskite films on perovskite substrates

Abstract

Cubic and pseudocubic perovskite films on perovskite substrates are used to study the influence of the lattice mismatch on the epitaxial growth of thin films on substrates of the same structure. For the growth of the films, a metalorganic decomposition route (MOD) using 2-ethylhexanoates and neodecanoates as precursors, was developed. The decomposition of the precursors was investigated with thermogravimetric analysis (TGA) and x-ray diffraction (XRD). The films were pin-coated on (001)-oriented SrTiO{sub 3}- and LaAlO{sub 3}-substrates, pyrolyzed and afterwards annealed between 600 C and 1,200 C. XRD-investigations and conventional transmission electron microscopy (CTEM) show, that epitaxial films with the orientation relationship [100](001) film {parallel} [100](001) substrate can be grown. With XRD, it could be shown, that not only ternary oxide films (SrZrO{sub 3}, BaZrO{sub 3} and BaCeO{sub 3}), but also perovskite solid solution films (SrTi{sub 0.5}Zr{sub 0.5}O{sub 3} and BaCe{sub 0.5}Zr{sub 0.5}O{sub 3}) can be prepared. Strong interdiffusion, detected by a shift of the film lattice parameter towards the substrate lattice parameter was found in SrZrO{sub 3}- and BaZrO{sub 3}-films on SrTiO{sub 3}, annealed at temperatures above 1050 C. High resolution electron microscopy (HREM) studies of SrZrO{sub 3} on SrTiO{sub 3} show that a crystalline semicoherent interface with a periodicalmore » array of misfit dislocations is present.« less

Authors:
; ;  [1];  [2]
  1. Max-Planck-Inst. fuer Metallforschung, Stuttgart (Germany). Inst. fuer Werkstoffwissenschaft
  2. Univ. of California, Santa Barbara, CA (United States)
Publication Date:
OSTI Identifier:
392158
Report Number(s):
CONF-951155-
ISBN 1-55899-304-5; TRN: 96:028526
Resource Type:
Book
Resource Relation:
Conference: Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 27 Nov - 1 Dec 1995; Other Information: PBD: 1996; Related Information: Is Part Of Epitaxial oxide thin films 2; Speck, J.S. [ed.] [Univ. of California, Santa Barbara, CA (United States)]; Fork, D.K. [ed.] [Xerox Palo Alto Research Center, CA (United States)]; Wolf, R.M. [ed.] [Philips Research Labs., Briarcliff Manor, NY (United States)]; Shiosaki, Tadashi [ed.] [Kyoto Univ. (Japan)]; PB: 577 p.; Materials Research Society symposium proceedings, Volume 401
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; STRONTIUM OXIDES; SPIN-ON COATING; CRYSTAL STRUCTURE; ZIRCONIUM OXIDES; BARIUM OXIDES; CERIUM OXIDES; TITANIUM OXIDES; LANTHANUM OXIDES; ALUMINIUM OXIDES; ORGANOMETALLIC COMPOUNDS; PYROLYSIS; THERMAL GRAVIMETRIC ANALYSIS; X-RAY DIFFRACTION; TRANSMISSION ELECTRON MICROSCOPY; ORIENTATION; SOLID SOLUTIONS; LATTICE PARAMETERS; ANNEALING; EXPERIMENTAL DATA

Citation Formats

Langjahr, P A, Wagner, T, Ruehle, M, and Lange, F F. Epitaxial growth and structure of cubic and pseudocubic perovskite films on perovskite substrates. United States: N. p., 1996. Web.
Langjahr, P A, Wagner, T, Ruehle, M, & Lange, F F. Epitaxial growth and structure of cubic and pseudocubic perovskite films on perovskite substrates. United States.
Langjahr, P A, Wagner, T, Ruehle, M, and Lange, F F. 1996. "Epitaxial growth and structure of cubic and pseudocubic perovskite films on perovskite substrates". United States.
@article{osti_392158,
title = {Epitaxial growth and structure of cubic and pseudocubic perovskite films on perovskite substrates},
author = {Langjahr, P A and Wagner, T and Ruehle, M and Lange, F F},
abstractNote = {Cubic and pseudocubic perovskite films on perovskite substrates are used to study the influence of the lattice mismatch on the epitaxial growth of thin films on substrates of the same structure. For the growth of the films, a metalorganic decomposition route (MOD) using 2-ethylhexanoates and neodecanoates as precursors, was developed. The decomposition of the precursors was investigated with thermogravimetric analysis (TGA) and x-ray diffraction (XRD). The films were pin-coated on (001)-oriented SrTiO{sub 3}- and LaAlO{sub 3}-substrates, pyrolyzed and afterwards annealed between 600 C and 1,200 C. XRD-investigations and conventional transmission electron microscopy (CTEM) show, that epitaxial films with the orientation relationship [100](001) film {parallel} [100](001) substrate can be grown. With XRD, it could be shown, that not only ternary oxide films (SrZrO{sub 3}, BaZrO{sub 3} and BaCeO{sub 3}), but also perovskite solid solution films (SrTi{sub 0.5}Zr{sub 0.5}O{sub 3} and BaCe{sub 0.5}Zr{sub 0.5}O{sub 3}) can be prepared. Strong interdiffusion, detected by a shift of the film lattice parameter towards the substrate lattice parameter was found in SrZrO{sub 3}- and BaZrO{sub 3}-films on SrTiO{sub 3}, annealed at temperatures above 1050 C. High resolution electron microscopy (HREM) studies of SrZrO{sub 3} on SrTiO{sub 3} show that a crystalline semicoherent interface with a periodical array of misfit dislocations is present.},
doi = {},
url = {https://www.osti.gov/biblio/392158}, journal = {},
number = ,
volume = ,
place = {United States},
year = {1996},
month = {11}
}

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