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Title: High-resolution multielement solid-state detectors

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147390· OSTI ID:389559
 [1]; ; ; ;  [2]
  1. Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza L. Da Vinci, 32, 20133 Milano (Italy)
  2. Brookhaven National Laboratory, Upton, NY 11973 (United States)

Recent advances in multielement solid-state detector systems for high rate, high resolution x-ray spectroscopy at noncryogenic temperatures will be described in this paper. A 16-channel silicon detector system, designed and built at BNL, has been recently operated in the NSLS machine beam {number_sign}X19A, showing an average energy resolution of less than 250 eV FWHM, which is adequate to discriminate the fluorescence trace element against the background of elastically scattered photons in a typical EXAFS application. A larger, 128 channel system, will soon permit a higher overall count rate: {approx_gt}10{sup 6} counts per second. It is shown that, in order to achieve high resolution with a solid-state detector, special care must be spent in the detector-preamplifier assembly. A low noise detectorpreamplifier may be obtained integrating the front-end devices (an FET and/or a feedback capacitor) with the detector itself. {copyright} {ital 1996 American Institute of Physics.}

OSTI ID:
389559
Report Number(s):
CONF-9510119-; ISSN 0034-6748; TRN: 96:027967
Journal Information:
Review of Scientific Instruments, Vol. 67, Issue 9; Conference: SRI `95: synchrotron radiation instrumentation symposium and the 7. users meeting for the advanced photon source (APS), Argonne, IL (United States), 16-20 Oct 1995; Other Information: PBD: Sep 1996
Country of Publication:
United States
Language:
English