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Title: Design and performance of a compact, versatile crystal bender for sagittal focusing of x-ray beams

Abstract

A focusing element that can be added to new and existing x-ray monochromators is described. The bender is used to focus 4 mrad of light into a 300 micron spot (4:1 demagnification). The focus is dynamically adjusted over the energy range 2.1 to 25 keV. This device is a working part of beamline X16C at the NSLS and is routinely used to collect surface diffraction, DAFS, and EXAFS data. Suggestions for its use in other beamlines, including insertion device lines at the APS, will be discussed. {copyright} {ital 1996 American Institute of Physics.}

Authors:
 [1]
  1. University of Illinois, Urbana-Champaign, Materials Research Laboratory, Bldg. 510E, Illinois (United States)
Publication Date:
OSTI Identifier:
389548
Report Number(s):
CONF-9510119-
Journal ID: RSINAK; ISSN 0034-6748; TRN: 96:027955
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 67; Journal Issue: 9; Conference: SRI `95: synchrotron radiation instrumentation symposium and the 7. users meeting for the advanced photon source (APS), Argonne, IL (United States), 16-20 Oct 1995; Other Information: PBD: Sep 1996
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; X-RAY EQUIPMENT; OPTICAL SYSTEMS; PHOTON BEAMS; FOCUSING; SYNCHROTRON RADIATION; DESIGN; PERFORMANCE TESTING; MONOCHROMATORS; MIRRORS; NSLS; BNL; KEV RANGE 01-10; KEV RANGE 10-100

Citation Formats

Adler, D, and Brookhaven National Laboratory, Upton, NY 11973. Design and performance of a compact, versatile crystal bender for sagittal focusing of x-ray beams. United States: N. p., 1996. Web. doi:10.1063/1.1147464.
Adler, D, & Brookhaven National Laboratory, Upton, NY 11973. Design and performance of a compact, versatile crystal bender for sagittal focusing of x-ray beams. United States. doi:10.1063/1.1147464.
Adler, D, and Brookhaven National Laboratory, Upton, NY 11973. Sun . "Design and performance of a compact, versatile crystal bender for sagittal focusing of x-ray beams". United States. doi:10.1063/1.1147464.
@article{osti_389548,
title = {Design and performance of a compact, versatile crystal bender for sagittal focusing of x-ray beams},
author = {Adler, D and Brookhaven National Laboratory, Upton, NY 11973},
abstractNote = {A focusing element that can be added to new and existing x-ray monochromators is described. The bender is used to focus 4 mrad of light into a 300 micron spot (4:1 demagnification). The focus is dynamically adjusted over the energy range 2.1 to 25 keV. This device is a working part of beamline X16C at the NSLS and is routinely used to collect surface diffraction, DAFS, and EXAFS data. Suggestions for its use in other beamlines, including insertion device lines at the APS, will be discussed. {copyright} {ital 1996 American Institute of Physics.}},
doi = {10.1063/1.1147464},
journal = {Review of Scientific Instruments},
number = 9,
volume = 67,
place = {United States},
year = {1996},
month = {9}
}