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Title: Radiation induced electrical degradation in ceramics insulators

Abstract

Radiation under the specific set of conditions has been shown to lead to severe electrical conductivity in insulators such as alumina. This study is devoted to examining the effects of radiation induced conductivity and electrical degradation in polycrystalline alumina and sapphire. Experiments were carried out at temperatures up to 823 K and an electric field of 500 kV/m. Experimental results show that radiation induced conductivity (RIC) in alumina consists of recoverable and permanent contributions when irradiated with charged particles. These two radiation induced effects are not completely separable and are functions of irradiation dose. In polycrystalline alumina, a significant increase in the permanent conductivity was observed after an incubation dose of 10{sup {minus}4} dpa. However only limited permanent electrical degradation was observed in single crystal samples at three times this damage level indicating the importance of grain boundaries in the radiation induced electrical degradation (RIED) process. Results from Rutherford Backscattering Spectroscopy (RBS) confirm that radiation enhanced diffusion of the gold contact is responsible for the degradation observed in polycrystalline alumina. {copyright} {ital 1996 American Institute of Physics.}

Authors:
; ;  [1]
  1. Materials Research and Education Center, 202 Ross Hall, Auburn University, Alabama 36849 (United States)
Publication Date:
OSTI Identifier:
385483
Report Number(s):
CONF-960109-
Journal ID: APCPCS; ISSN 0094-243X; TRN: 96:026244
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 361; Journal Issue: 1; Conference: STAIF 96: space technology and applications international forum, Albuquerque, NM (United States), 7-11 Jan 1996; Other Information: PBD: Mar 1996
Country of Publication:
United States
Language:
English
Subject:
66 PHYSICS; ELECTRICAL INSULATORS; RADIATION EFFECTS; ALUMINIUM OXIDES; SAPPHIRE; CERAMICS; POLYCRYSTALS; SURFACE CONDUCTIVITY

Citation Formats

Patuwathavithane, C, Yeh, W, and Zee, R H. Radiation induced electrical degradation in ceramics insulators. United States: N. p., 1996. Web. doi:10.1063/1.50064.
Patuwathavithane, C, Yeh, W, & Zee, R H. Radiation induced electrical degradation in ceramics insulators. United States. https://doi.org/10.1063/1.50064
Patuwathavithane, C, Yeh, W, and Zee, R H. 1996. "Radiation induced electrical degradation in ceramics insulators". United States. https://doi.org/10.1063/1.50064.
@article{osti_385483,
title = {Radiation induced electrical degradation in ceramics insulators},
author = {Patuwathavithane, C and Yeh, W and Zee, R H},
abstractNote = {Radiation under the specific set of conditions has been shown to lead to severe electrical conductivity in insulators such as alumina. This study is devoted to examining the effects of radiation induced conductivity and electrical degradation in polycrystalline alumina and sapphire. Experiments were carried out at temperatures up to 823 K and an electric field of 500 kV/m. Experimental results show that radiation induced conductivity (RIC) in alumina consists of recoverable and permanent contributions when irradiated with charged particles. These two radiation induced effects are not completely separable and are functions of irradiation dose. In polycrystalline alumina, a significant increase in the permanent conductivity was observed after an incubation dose of 10{sup {minus}4} dpa. However only limited permanent electrical degradation was observed in single crystal samples at three times this damage level indicating the importance of grain boundaries in the radiation induced electrical degradation (RIED) process. Results from Rutherford Backscattering Spectroscopy (RBS) confirm that radiation enhanced diffusion of the gold contact is responsible for the degradation observed in polycrystalline alumina. {copyright} {ital 1996 American Institute of Physics.}},
doi = {10.1063/1.50064},
url = {https://www.osti.gov/biblio/385483}, journal = {AIP Conference Proceedings},
number = 1,
volume = 361,
place = {United States},
year = {Fri Mar 01 00:00:00 EST 1996},
month = {Fri Mar 01 00:00:00 EST 1996}
}