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Title: Adhesion measurement and analysis at cell/encapsulant interface as quality control tools during PV module manufacture

Abstract

MDRC Techniques are used for the detection of the vulnerability in specific regions in a PV module. They can also be useful as quality control tools. PV modules were selected randomly at the factory floor over a sixteen month period. Adequate number of samples were extracted at predetermined locations in the middle, periphery, and bus line regions from a selected cells of each module. Adhesive shear strength was measured during the extraction of the samples. Care was taken to verify that the data was statistically significant. Consistently high values of adhesive strength are desirable in all the regions. There was a smaller spread of values in the batches with higher adhesive strengths. On the other hand, the data showed wider fluctuations in the batches of lower average values of adhesive shear strength showing that inhomogeneity from one region to other may be leading to overall low values. The techniques were found to be useful for assuring quality. The information may be useful for determining warranty period. {copyright} {ital 1999 American Institute of Physics.}

Authors:
; ; ; ;  [1]; ;  [2]
  1. Florida Solar Energy Center, 1679 Clearlake Road, Cocoa, Florida 32922-5703 (United States)
  2. Sandia National Laboratories, Albuquerque, New Mexico 87185-0752 (United States)
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
355405
Report Number(s):
CONF-980935-
Journal ID: APCPCS; ISSN 0094-243X; TRN: 9915M0087
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 462; Journal Issue: 1; Conference: 15. National Center for Photovoltaics program review conference, Denver, CO (United States), 9-11 Sep 1998; Other Information: PBD: Mar 1999
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; SHEAR PROPERTIES; SOLAR CELL ARRAYS; QUALITY CONTROL; MEASURING METHODS; ENCAPSULATION; ADHESION

Citation Formats

Dhere, N.G., Gadre, K.S., Raravikar, N.R., Kulkarni, S.R., Jamkhandi, P.S., Quintana, M.A., and King, D.L.. Adhesion measurement and analysis at cell/encapsulant interface as quality control tools during PV module manufacture. United States: N. p., 1999. Web. doi:10.1063/1.57925.
Dhere, N.G., Gadre, K.S., Raravikar, N.R., Kulkarni, S.R., Jamkhandi, P.S., Quintana, M.A., & King, D.L.. Adhesion measurement and analysis at cell/encapsulant interface as quality control tools during PV module manufacture. United States. doi:10.1063/1.57925.
Dhere, N.G., Gadre, K.S., Raravikar, N.R., Kulkarni, S.R., Jamkhandi, P.S., Quintana, M.A., and King, D.L.. Mon . "Adhesion measurement and analysis at cell/encapsulant interface as quality control tools during PV module manufacture". United States. doi:10.1063/1.57925.
@article{osti_355405,
title = {Adhesion measurement and analysis at cell/encapsulant interface as quality control tools during PV module manufacture},
author = {Dhere, N.G. and Gadre, K.S. and Raravikar, N.R. and Kulkarni, S.R. and Jamkhandi, P.S. and Quintana, M.A. and King, D.L.},
abstractNote = {MDRC Techniques are used for the detection of the vulnerability in specific regions in a PV module. They can also be useful as quality control tools. PV modules were selected randomly at the factory floor over a sixteen month period. Adequate number of samples were extracted at predetermined locations in the middle, periphery, and bus line regions from a selected cells of each module. Adhesive shear strength was measured during the extraction of the samples. Care was taken to verify that the data was statistically significant. Consistently high values of adhesive strength are desirable in all the regions. There was a smaller spread of values in the batches with higher adhesive strengths. On the other hand, the data showed wider fluctuations in the batches of lower average values of adhesive shear strength showing that inhomogeneity from one region to other may be leading to overall low values. The techniques were found to be useful for assuring quality. The information may be useful for determining warranty period. {copyright} {ital 1999 American Institute of Physics.}},
doi = {10.1063/1.57925},
journal = {AIP Conference Proceedings},
number = 1,
volume = 462,
place = {United States},
year = {Mon Mar 01 00:00:00 EST 1999},
month = {Mon Mar 01 00:00:00 EST 1999}
}