High resolution pulsed field ionization photoelectron spectroscopy using multibunch synchrotron radiation: Time-of-flight selection scheme
- Chemical Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
- Ames Laboratory, United States Department of Energy and Department of Chemistry, Iowa State University, Ames, Iowa 50011 (United States)
We have developed an efficient electron time-of-flight (TOF) selection scheme for high resolution pulsed field ionization (PFI) photoelectron (PFI-PE) measurements using monochromatized multibunch undulator synchrotron radiation at the Advanced Light Source. By employing a simple electron TOF spectrometer, we show that PFI-PEs produced by the PFI in the dark gap of a synchrotron ring period can be cleanly separated from prompt background photoelectrons. A near complete suppression of prompt electrons was achieved in PFI-PE measurements by gating the PFI-PE TOF peak, as indicated by monitoring background electron counts at the Ar(11s{sup {prime}}) autoionizing Rydberg peak, which is adjacent to the Ar{sup +}({sup 2}P{sub 3/2}) PFI-PE band. The rotational-resolved PFI-PE band for H{sub 2}{sup +} (X {sup 2}{Sigma}{sub g}{sup +},v{sup +}=0) measured using this electron TOF selection scheme is nearly free from residues of nearby autoionizing features, which were observed in the previous measurement by employing an electron spectrometer equipped with a hemispherical energy analyzer. This comparison indicates that the TOF PFI-PE scheme is significantly more effective in suppressing the hot-electron background. In addition to attaining a high PFI-PE transmission, a major advantage of the electron TOF scheme is that it allows the use of a smaller pulsed electric field and thus results in a higher instrumental PFI-PE resolution. We have demonstrated instrumental resolutions of 1.0 cm{sup {minus}1} full width at half maximum (FWHM) and 1.9 cm{sup {minus}1} FWHM in the PFI-PE bands for Xe{sup +}({sup 2}P{sub 3/2}) and Ar{sup +}({sup 2}P{sub 3/2}) at 12.123 and 15.760 eV, respectively. These resolutions are more than a factor 2 better than those achieved in previous synchrotron based PFI-PE studies. {copyright} {ital 1999 American Institute of Physics.}
- OSTI ID:
- 348251
- Journal Information:
- Review of Scientific Instruments, Vol. 70, Issue 6; Other Information: PBD: Jun 1999
- Country of Publication:
- United States
- Language:
- English
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