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Title: Mass spectroscopy of recoiled ions, secondary ion mass spectroscopy, and Auger electron spectroscopy investigation of Y{sub 2}O{sub 3}-stabilized ZrO{sub 2}(100) and (110)

Journal Article · · Journal of Vacuum Science and Technology, A
DOI:https://doi.org/10.1116/1.581668· OSTI ID:337517
; ; ;  [1]
  1. Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99352 (United States)

We have studied the (100) and (110) surfaces of yttria-stabilized cubic ZrO{sub 2} using Auger electron spectroscopy, low energy electron diffraction (LEED), direct recoil spectroscopy, mass spectroscopy of recoiled ions (MSRI), and secondary ion mass spectroscopy (SIMS). The concentration of yttrium at the surface was weakly influenced by the surface structure under the experimental conditions investigated. Both MSRI and SIMS indicated a more enhanced yttrium signal than zirconium signal at the surface compared to the respective bulk concentrations. The surfaces were not very well ordered as indicated by LEED. The yttria-stabilized cubic ZrO{sub 2} single crystal surfaces may not be a suitable model material for pure phase ZrO{sub 2} surfaces due to significant yttria concentrations at the surface. {copyright} {ital 1999 American Vacuum Society.}

OSTI ID:
337517
Journal Information:
Journal of Vacuum Science and Technology, A, Vol. 17, Issue 3; Other Information: PBD: May 1999
Country of Publication:
United States
Language:
English