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Title: Refracted X-ray fluorescence (RXF) applied to the study of thin films and thermally-grown oxide scales

Abstract

Refracted X-ray fluorescence (RXF) is a relatively new technique developed for studying properties of thin films. In this paper, formalism for analysis of RXF measurements is derived from a new perspective. The technique is applied to the study of thermally grown oxide scales; model predictions are tested. The evolution of chromia scales on Fe-25Cr-20Ni-0.3Y alloys and some aspects of alumina scales grown on {beta}-NiAl are investigated. Some of the data were taken in situ, during the oxidation process. Deposited films of Fe-25Cr-20Ni-0.3Y alloys of varying thickness and the oxidation of those films were also studied. The technique is generally applicable to thin-film studies. It provides scale-composition and depth-profile information, scale thicknesses and growth rates, and information about transient-phase evolution.

Authors:
; ;  [1]
  1. Argonne National Lab., IL (United States). Materials Science Div.
Publication Date:
OSTI Identifier:
335258
Resource Type:
Journal Article
Journal Name:
Oxidation of Metals
Additional Journal Information:
Journal Volume: 51; Journal Issue: 1-2; Other Information: PBD: Feb 1999
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; OXIDATION; IRON ALLOYS; CHROMIUM ALLOYS; NICKEL ALLOYS; ALUMINIUM ALLOYS; SCALING; X-RAY FLUORESCENCE ANALYSIS; THIN FILMS; CHEMICAL COMPOSITION; IN-SITU PROCESSING

Citation Formats

Koshelev, I, Paulikas, A P, and Veal, B W. Refracted X-ray fluorescence (RXF) applied to the study of thin films and thermally-grown oxide scales. United States: N. p., 1999. Web. doi:10.1023/A:1018898018004.
Koshelev, I, Paulikas, A P, & Veal, B W. Refracted X-ray fluorescence (RXF) applied to the study of thin films and thermally-grown oxide scales. United States. https://doi.org/10.1023/A:1018898018004
Koshelev, I, Paulikas, A P, and Veal, B W. 1999. "Refracted X-ray fluorescence (RXF) applied to the study of thin films and thermally-grown oxide scales". United States. https://doi.org/10.1023/A:1018898018004.
@article{osti_335258,
title = {Refracted X-ray fluorescence (RXF) applied to the study of thin films and thermally-grown oxide scales},
author = {Koshelev, I and Paulikas, A P and Veal, B W},
abstractNote = {Refracted X-ray fluorescence (RXF) is a relatively new technique developed for studying properties of thin films. In this paper, formalism for analysis of RXF measurements is derived from a new perspective. The technique is applied to the study of thermally grown oxide scales; model predictions are tested. The evolution of chromia scales on Fe-25Cr-20Ni-0.3Y alloys and some aspects of alumina scales grown on {beta}-NiAl are investigated. Some of the data were taken in situ, during the oxidation process. Deposited films of Fe-25Cr-20Ni-0.3Y alloys of varying thickness and the oxidation of those films were also studied. The technique is generally applicable to thin-film studies. It provides scale-composition and depth-profile information, scale thicknesses and growth rates, and information about transient-phase evolution.},
doi = {10.1023/A:1018898018004},
url = {https://www.osti.gov/biblio/335258}, journal = {Oxidation of Metals},
number = 1-2,
volume = 51,
place = {United States},
year = {Mon Feb 01 00:00:00 EST 1999},
month = {Mon Feb 01 00:00:00 EST 1999}
}