Possible role for secondary particles in proton-induced single event upsets of modern devices

Journal Article · Tue Dec 01 00:00:00 EST 1998 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.736523· OSTI ID:323952

Savage, M W; McNulty, P J; Roth, D R ^[1]; Foster, C C ^[2]

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1. Clemson Univ., SC (United States). Dept. of Physics
2. Indiana Univ., Bloomington, IN (United States). Cyclotron Facility

Increases in the SEU sensitivity of some modern COTS devices suggest that other reactions besides the direct spallation reaction may begin to play a role in proton SEU events, but only in devices with upset thresholds significantly lower than devices currently flown in space or sold commercially for terrestrial applications. Triple coincidence tagged proton exposures and neutron exposures are combined to demonstrate these reactions in the same device.

• OSTI ID: 323952
• Report Number(s): CONF-980705-; ISSN 0018-9499; TRN: 99:004472
• Journal Information: IEEE Transactions on Nuclear Science, Vol. 45, Issue 6Pt1; Conference: IEEE nuclear and space radiation effects conference, Newport Beach, CA (United States), 20-24 Jul 1998; Other Information: PBD: Dec 1998
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ERRORS
SENSITIVITY
MICROELECTRONIC CIRCUITS
PROTONS
NEUTRONS
NUCLEAR REACTIONS
PHYSICAL RADIATION EFFECTS
CHARGE COLLECTION