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Title: A CdTe position sensitive detector for a hard X- and gamma-ray wide field camera

Book ·
OSTI ID:323856
; ; ; ; ;  [1]; ;  [2];  [3]
  1. Ist. TESRE/CNR, Bologna (Italy)
  2. Politecnico, Milano (Italy). Dipt. di Elettronica ed Informatica
  3. IFCTR/CNR, Milano (Italy)

An important region of the electromagnetic spectrum for astrophysics is the hard X- and gamma ray band between 10 keV and a few MeV, where several processes occur in a wide variety of objects and with different spatial distribution and time scales. In order to fulfill the observational requirements in this energy range and taking into account the opportunities given by small/medium size missions (e.g., on the ISS), the authors have proposed a compact, wide field camera based on a thick (1 cm) position sensitive CdTe detector (PSD). The detector is made of an array of 128x96 CdTe microspectrometers with a pixel size of 2x2 mm{sup 2}. The basic element of the PSD is the linear module that is an independent detection unit with 32 CdTe crystals and monolithic front-electronics (ASIC) supported by a thin (300 {micro}m) ceramic layer. The expected performance of the PSD over the operative energy range and some of the required ASIC functionality are presented and discussed.

OSTI ID:
323856
Report Number(s):
CONF-971201-; TRN: 99:004388
Resource Relation:
Conference: 1997 fall meeting of the Materials Research Society, Boston, MA (United States), 1-5 Dec 1997; Other Information: PBD: 1998; Related Information: Is Part Of Semiconductors for room-temperature radiation detector applications 2; James, R.B. [ed.] [Sandia National Labs., Livermore, CA (United States)]; Schlesinger, T.E. [ed.] [Carnegie Mellon Univ., Pittsburgh, PA (United States)]; Siffert, P. [ed.] [Lab. PHASE/CNRS, Strasbourg (France)]; Dusi, W. [ed.] [Inst. TESRE/CNR, Bologna (Italy)]; Squillante, M.R. [ed.] [Radiation Monitoring Devices, Inc., Watertown, MA (United States)]; O`Connell, M. [ed.] [Dept. of Energy, Washington, DC (United States)]; Cuzin, M. [ed.] [LETI/CEA, Grenoble (France)]; PB: 681 p.; Materials Research Society symposium proceedings, Volume 487
Country of Publication:
United States
Language:
English