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Title: Longevity of optically activated, high gain GaAs photoconductive semiconductor switches

Journal Article · · IEEE Transactions on Plasma Science
DOI:https://doi.org/10.1109/27.736024· OSTI ID:321004
; ; ; ; ; ; ;  [1];  [2]
  1. Sandia National Labs., Albuquerque, NM (United States)
  2. OptoMetrix Inc., Renton, WA (United States)

The longevity of high gain GaAs photoconductive semiconductor switches (PCSS`s) has been extended to well over ten million pulses by reducing the density of carriers at the semiconductor to metal interface. This was achieved by reducing the density in the vertical and lateral directions. The latter was achieved by varying the spatial distribution of the trigger light thereby widening the current filaments that are characteristic of the high gain switches. The authors reduced the carrier density in the vertical direction by using ion implantation. These results were obtained of currents of about 10 A, current duration of 3.5 ns, and switched voltage of {approximately}2kV. At currents of {approximately}70 A, the switches last for 0.6 million pulses. In order to improve the performance at high currents, new processes such as deep diffusion and epitaxial growth of contacts are being pursued. To guide this effort they recorded open shutter, infra-red images, and time-resolved Schlieren images of the current filaments, which form during high gain switching. They measured, under varying conditions, a carrier (electrons or holes) density that ranges from 3 {times} 10{sup 17} cm{sup {minus}3} to 6 {times} 10{sup 18} cm{sup {minus}3}.

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
321004
Journal Information:
IEEE Transactions on Plasma Science, Vol. 26, Issue 5; Other Information: PBD: Oct 1998
Country of Publication:
United States
Language:
English