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Title: Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies

Abstract

In this paper the authors present an evaluation of the pulsed laser as a technique for single events effects (SEE) testing. They explore in detail the important optical effects, such as laser beam propagation, surface reflection, and linear and nonlinear absorption, which determine the nature of laser-generated charge tracks in semiconductor materials. While there are differences in the structure of laser- and ion-generated charge tracks, they show that in many cases the pulsed laser remains an invaluable tool for SEE testing. Indeed, for several SEE applications, they show that the pulsed laser method represents a more practical approach than conventional accelerator-based methods.

Authors:
; ; ; ; ;  [1];  [2]
  1. Naval Research Lab., Washington, DC (United States)
  2. Army Research Lab., Adelphi, MD (United States)
Publication Date:
OSTI Identifier:
32032
Report Number(s):
CONF-940726-
Journal ID: IETNAE; ISSN 0018-9499; TRN: IM9517%%327
Resource Type:
Journal Article
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 41; Journal Issue: 6Pt1; Conference: 31. annual international nuclear and space radiation effects conference, Tucson, AZ (United States), 18-22 Jul 1994; Other Information: PBD: Dec 1994
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; SEMICONDUCTOR DEVICES; PERFORMANCE TESTING; PHYSICAL RADIATION EFFECTS; LASER RADIATION; PARTICLE TRACKS; CHARGE COLLECTION; SPACE FLIGHT

Citation Formats

Melinger, J.S., Buchner, S., McMorrow, D., Stapor, W.J., Weatherford, T.R., Campbell, A.B., and Eisen, H. Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies. United States: N. p., 1994. Web. doi:10.1109/23.340618.
Melinger, J.S., Buchner, S., McMorrow, D., Stapor, W.J., Weatherford, T.R., Campbell, A.B., & Eisen, H. Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies. United States. doi:10.1109/23.340618.
Melinger, J.S., Buchner, S., McMorrow, D., Stapor, W.J., Weatherford, T.R., Campbell, A.B., and Eisen, H. Thu . "Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies". United States. doi:10.1109/23.340618.
@article{osti_32032,
title = {Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies},
author = {Melinger, J.S. and Buchner, S. and McMorrow, D. and Stapor, W.J. and Weatherford, T.R. and Campbell, A.B. and Eisen, H.},
abstractNote = {In this paper the authors present an evaluation of the pulsed laser as a technique for single events effects (SEE) testing. They explore in detail the important optical effects, such as laser beam propagation, surface reflection, and linear and nonlinear absorption, which determine the nature of laser-generated charge tracks in semiconductor materials. While there are differences in the structure of laser- and ion-generated charge tracks, they show that in many cases the pulsed laser remains an invaluable tool for SEE testing. Indeed, for several SEE applications, they show that the pulsed laser method represents a more practical approach than conventional accelerator-based methods.},
doi = {10.1109/23.340618},
journal = {IEEE Transactions on Nuclear Science},
number = 6Pt1,
volume = 41,
place = {United States},
year = {1994},
month = {12}
}