Sensitivity measurements of a microchannel plate intensified x-ray detector in the 100{endash}1500 eV photon energy range (abstract)
- Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
Microchannel plate intensified (MPI) x-ray detectors are commonly used for imaging and spectral measurements in the 100{endash}1500 eV photon energy range. Using a laser-produced plasma x-ray source, we measured the integrated detector response versus incident x-ray intensity and the relative efficiency versus photon energy of a MPI x-ray detector. Two identical 2000 lines/mm transmission grating spectrometers simultaneously record broadband plasma source emission from a tantalum target. The relative efficiency was determined by comparing the spectrum recorded with an absolutely calibrated x-ray CCD reference detector on one spectrometer to the spectrum recorded with a MPI x-ray detector on the other spectrometer. The integrated detector response versus incident x-ray intensity was measured by simultaneously illuminating the CCD reference detector and the MPI detector with step-wedge-filtered magnesium plasma emission. The aluminum step wedge x-ray filters pass the 1s{endash}2p emission lines of H-like Mg at 1470 eV and the 1s{sup 2}{endash}1s2p emission lines of He-like Mg at 1350 eV, and provide a four order of magnitude range in incident intensity on the detectors.{copyright} {ital 1999 American Institute of Physics.}
- OSTI ID:
- 295638
- Report Number(s):
- CONF-980605-; ISSN 0034-6748; TRN: 99:001824
- Journal Information:
- Review of Scientific Instruments, Vol. 70, Issue 1; Conference: 12. topical conference on high-temperature plasma diagnostics, Princeton, NJ (United States), 7-11 Jun 1998; Other Information: PBD: Jan 1999
- Country of Publication:
- United States
- Language:
- English
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