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Title: Failure probability prediction of dielectric ceramics in multilayer capacitors

Abstract

Dielectric ceramics in multilayer capacitors are subjected to manufacturing or service thermomechanical stresses which, if severe enough, will cause mechanical failure and perhaps subsequent loss of electrical function. Strength of monolithic ceramics is probabilistic in nature; however, probabilistic design of such electronic ceramic components generally has not been used by manufacturers and end-users of these components. To illustrate how probabilistic design may be utilized for small components, the present study demonstrates the applicability of an existing probabilistic life design computer code in the prediction of failure probability of a dielectric ceramic in an arbitrary multilayer capacitor. Issues involving the generation of representative strength and fatigue data for specimens at this small scale and the ultimate failure probability prediction of dielectric ceramics in multilayer capacitors are presented. Additionally, alternative means to generate a strength distribution as input for the probabilistic life design computer codes which are under consideration by the authors are discussed.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Oak Ridge National Lab., TN (United States)
Sponsoring Org.:
USDOE Assistant Secretary for Energy Efficiency and Renewable Energy, Washington, DC (United States)
OSTI Identifier:
290938
Report Number(s):
ORNL/CP-98893; CONF-980521-
ON: DE99000366; BR: EE0402000; TRN: AHC29901%%143
DOE Contract Number:  
AC05-96OR22464
Resource Type:
Technical Report
Resource Relation:
Conference: 100. annual meeting of the American Ceramic Society, Cincinnati, OH (United States), 3-6 May 1998; Other Information: PBD: [1998]
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; FRACTURE PROPERTIES; CERAMICS; CAPACITORS; PREDICTION EQUATIONS; COMPUTER CALCULATIONS; PROBABILITY; FINITE ELEMENT METHOD; STRESSES; THEORETICAL DATA

Citation Formats

Wereszczak, A A, Breder, K, Ferber, M K, Bridge, R J, Riester, L, and Kirkland, T P. Failure probability prediction of dielectric ceramics in multilayer capacitors. United States: N. p., 1998. Web. doi:10.2172/290938.
Wereszczak, A A, Breder, K, Ferber, M K, Bridge, R J, Riester, L, & Kirkland, T P. Failure probability prediction of dielectric ceramics in multilayer capacitors. United States. doi:10.2172/290938.
Wereszczak, A A, Breder, K, Ferber, M K, Bridge, R J, Riester, L, and Kirkland, T P. Sun . "Failure probability prediction of dielectric ceramics in multilayer capacitors". United States. doi:10.2172/290938. https://www.osti.gov/servlets/purl/290938.
@article{osti_290938,
title = {Failure probability prediction of dielectric ceramics in multilayer capacitors},
author = {Wereszczak, A A and Breder, K and Ferber, M K and Bridge, R J and Riester, L and Kirkland, T P},
abstractNote = {Dielectric ceramics in multilayer capacitors are subjected to manufacturing or service thermomechanical stresses which, if severe enough, will cause mechanical failure and perhaps subsequent loss of electrical function. Strength of monolithic ceramics is probabilistic in nature; however, probabilistic design of such electronic ceramic components generally has not been used by manufacturers and end-users of these components. To illustrate how probabilistic design may be utilized for small components, the present study demonstrates the applicability of an existing probabilistic life design computer code in the prediction of failure probability of a dielectric ceramic in an arbitrary multilayer capacitor. Issues involving the generation of representative strength and fatigue data for specimens at this small scale and the ultimate failure probability prediction of dielectric ceramics in multilayer capacitors are presented. Additionally, alternative means to generate a strength distribution as input for the probabilistic life design computer codes which are under consideration by the authors are discussed.},
doi = {10.2172/290938},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1998},
month = {11}
}