skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: {ital Ab initio} pseudopotential calculations of B diffusion and pairing in Si

Journal Article · · Physical Review, B: Condensed Matter
; ; ;  [1];  [2]
  1. Lawrence Livermore National Laboratory, University of California, Livermore, California 94551 (United States)
  2. Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974 (United States)

The {ital ab} {ital initio} pseudopotential method was used to study the boron diffusion and pairing process in crystalline silicon. The results show that substitutional B attracts interstitial Si with a binding energy of 1.1 {plus_minus} 0.1 eV. We show that B diffusion is significantly enhanced in the presence of the Si interstitial due to the substantial lowering of the migrational barrier through most likely a kick-out mechanism. The resulting mobile boron can also be trapped by another substitutional boron with a binding energy of 1.8 {plus_minus} 0.1 eV, forming an immobile and electrically inactive two-boron pair along a {l_angle}001{r_angle} direction. It is also found that the pairing of these two boron atoms involves the trapping of a Si interstitial. Alternatively, two B pairs that do not trap the Si interstitial were found to be energetically unfavorable. All of these findings are consistent with experimental results. {copyright} {ital 1996 The American Physical Society.}

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
286721
Journal Information:
Physical Review, B: Condensed Matter, Vol. 54, Issue 7; Other Information: PBD: Aug 1996
Country of Publication:
United States
Language:
English

Similar Records

{ital Ab Initio} Pseudopotential calculations of dopant diffusion in Si
Conference · Mon Apr 28 00:00:00 EDT 1997 · OSTI ID:286721

Ab initio pseudopotential calculations of carbon impurities in Si
Conference · Sat Nov 01 00:00:00 EST 1997 · OSTI ID:286721

Mechanism of Boron Diffusion in Silicon: An Ab Initio and Kinetic Monte Carlo Study
Journal Article · Mon Nov 22 00:00:00 EST 1999 · Physical Review Letters · OSTI ID:286721