Characteristic analysis of coupled microstrip patch resonators on ferrimagnetic substrates
- Department of Technology, Jackson State University, Jackson, Mississippi 39217 (United States)
- Department of EE, The Hong Kong Polytechnic University (Hong Kong)
- Center for Beam Physics, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)
This paper is to use the spectral-domain technique to perform characteristic analysis of coupled microstrip patch resonators on ferrimagnetic substrates. Our formulation has been validated by comparing our result with the published data and showing an excellent agreement between them. Numerical computations have been performed to obtain dependence of resonant frequency on patch dimensions, offset and separation between the two patches, thicknesses of ferrimagnetic film and substrate. It has been seen that as the length of the patch increases the resonant frequency decreases. The larger the offset between the two patches the lower the resonant frequency. The separation between the two patches strongly affects the resonant frequency. It is also found that the resonant frequency increases as the width of the patch decreases. For the fixed dimensions, separation and offset, a thinner substrate results in a higher resonant frequency, and in contrast, a thinner ferrimagnetic film results in a lower resonant frequency. {copyright} {ital 1996 American Institute of Physics.}
- OSTI ID:
- 280071
- Report Number(s):
- CONF-951101-; ISSN 0021-8979; TRN: 9608M0127
- Journal Information:
- Journal of Applied Physics, Vol. 79, Issue 8; Conference: 40. conference on magnetism and magnetic materials, Philadelphia, PA (United States), 6-9 Nov 1995; Other Information: PBD: Apr 1996
- Country of Publication:
- United States
- Language:
- English
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