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Title: Identification of light charged particles and heavy ions in silicon detectors by means of pulse-shape discrimination

Abstract

Pulse-shape discrimination with totally depleted Si-detectors in reverse mount has been investigated and shown to be an excellent method of charged-particle identification in the energy range of {approx}2 to 20 AMeV. In test experiments with heavy-ion beams the authors obtained element identification up to Ti and isotope resolution even for elements heavier than carbon. The promising results and the simplicity of the electronics recommend this technique for applications in multidetector arrays. In particular, small and compact 4{pi} Si balls with relatively low thresholds for charged-particle identification to be combined with 4{pi} neutron detectors or {gamma} arrays can be constructed.

Authors:
;  [1];  [2]
  1. Forschungszentrum Rossendorf, Dresden (Germany). Inst. fuer Kern- und Hadronenphysik
  2. Hahn-Meitner-Inst. Berlin (Germany). Bereich Festkoerperphysik; and others
Publication Date:
OSTI Identifier:
277619
Report Number(s):
CONF-951073-
Journal ID: IETNAE; ISSN 0018-9499; TRN: 96:018072
Resource Type:
Journal Article
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 43; Journal Issue: 3Pt2; Conference: IEEE nuclear science symposium and medical imaging conference, San Francisco, CA (United States), 21-28 Oct 1995; Other Information: PBD: Jun 1996
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; CHARGED PARTICLE DETECTION; SI SEMICONDUCTOR DETECTORS; PULSE DISCRIMINATORS; FOUR-PI DETECTORS; GAMMA DETECTION; PARTICLE IDENTIFICATION

Citation Formats

Pausch, G, Ortlepp, H G, and Bohne, W. Identification of light charged particles and heavy ions in silicon detectors by means of pulse-shape discrimination. United States: N. p., 1996. Web. doi:10.1109/23.506644.
Pausch, G, Ortlepp, H G, & Bohne, W. Identification of light charged particles and heavy ions in silicon detectors by means of pulse-shape discrimination. United States. doi:10.1109/23.506644.
Pausch, G, Ortlepp, H G, and Bohne, W. Sat . "Identification of light charged particles and heavy ions in silicon detectors by means of pulse-shape discrimination". United States. doi:10.1109/23.506644.
@article{osti_277619,
title = {Identification of light charged particles and heavy ions in silicon detectors by means of pulse-shape discrimination},
author = {Pausch, G and Ortlepp, H G and Bohne, W},
abstractNote = {Pulse-shape discrimination with totally depleted Si-detectors in reverse mount has been investigated and shown to be an excellent method of charged-particle identification in the energy range of {approx}2 to 20 AMeV. In test experiments with heavy-ion beams the authors obtained element identification up to Ti and isotope resolution even for elements heavier than carbon. The promising results and the simplicity of the electronics recommend this technique for applications in multidetector arrays. In particular, small and compact 4{pi} Si balls with relatively low thresholds for charged-particle identification to be combined with 4{pi} neutron detectors or {gamma} arrays can be constructed.},
doi = {10.1109/23.506644},
journal = {IEEE Transactions on Nuclear Science},
number = 3Pt2,
volume = 43,
place = {United States},
year = {1996},
month = {6}
}