Electron ptychography is a powerful computational method for atomic-resolution imaging with high contrast for weakly and strongly scattering elements. Modern algorithms coupled with fast and efficient detectors allow imaging specimens with tens of nanometers thicknesses with sub-0.5 Ångstrom lateral resolution. However, the axial resolution in these approaches is currently limited to a few nanometers, limiting their ability to solve novel atomic structures ab initio. Here, we experimentally demonstrate multi-slice ptychographic electron tomography, which allows atomic resolution three-dimensional phase-contrast imaging in a volume surpassing the depth of field limits. We reconstruct tilt-series 4D-STEM measurements of a $$\mathrm{Co_3O_4}$$ nanocube, yielding 2 Å axial and 0.7 Å transverse resolution in a reconstructed volume of $$\mathrm{(18.2\,nm)^3}$$. Our results demonstrate a 13.5-fold improvement in axial resolution compared to multi-slice ptychography while retaining the atomic lateral resolution and the capability to image volumes beyond the depth of field limit. Multi-slice ptychographic electron tomography significantly expands the volume of materials accessible using high-resolution electron microscopy. We discuss further experimental and algorithmic improvements necessary to also resolve single weakly scattering atoms in 3D.
Romanov, Andrey, Cho, Min Gee, Scott, Mary Cooper, & Pelz, Philipp (2024). Multi-slice electron ptychographic tomography for three-dimensional phase-contrast microscopy beyond the depth of focus limits. JPhys Materials, 8(1). https://doi.org/10.1088/2515-7639/ad9ad2
Romanov, Andrey, Cho, Min Gee, Scott, Mary Cooper, et al., "Multi-slice electron ptychographic tomography for three-dimensional phase-contrast microscopy beyond the depth of focus limits," JPhys Materials 8, no. 1 (2024), https://doi.org/10.1088/2515-7639/ad9ad2
@article{osti_2496631,
author = {Romanov, Andrey and Cho, Min Gee and Scott, Mary Cooper and Pelz, Philipp},
title = {Multi-slice electron ptychographic tomography for three-dimensional phase-contrast microscopy beyond the depth of focus limits},
annote = {Electron ptychography is a powerful computational method for atomic-resolution imaging with high contrast for weakly and strongly scattering elements. Modern algorithms coupled with fast and efficient detectors allow imaging specimens with tens of nanometers thicknesses with sub-0.5 Ångstrom lateral resolution. However, the axial resolution in these approaches is currently limited to a few nanometers, limiting their ability to solve novel atomic structures ab initio. Here, we experimentally demonstrate multi-slice ptychographic electron tomography, which allows atomic resolution three-dimensional phase-contrast imaging in a volume surpassing the depth of field limits. We reconstruct tilt-series 4D-STEM measurements of a $\mathrm{Co_3O_4}$ nanocube, yielding 2 Å axial and 0.7 Å transverse resolution in a reconstructed volume of $\mathrm{(18.2\,nm)^3}$. Our results demonstrate a 13.5-fold improvement in axial resolution compared to multi-slice ptychography while retaining the atomic lateral resolution and the capability to image volumes beyond the depth of field limit. Multi-slice ptychographic electron tomography significantly expands the volume of materials accessible using high-resolution electron microscopy. We discuss further experimental and algorithmic improvements necessary to also resolve single weakly scattering atoms in 3D.},
doi = {10.1088/2515-7639/ad9ad2},
url = {https://www.osti.gov/biblio/2496631},
journal = {JPhys Materials},
issn = {ISSN 2515-7639},
number = {1},
volume = {8},
place = {United States},
publisher = {IOP Publishing},
year = {2024},
month = {12}}
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 367, Issue 1903https://doi.org/10.1098/rsta.2009.0074