Single-event effects in analog and mixed-signal integrated circuits
Journal Article
·
· IEEE Transactions on Nuclear Science
- NSWC, Crane, IN (United States)
Analog and mixed-signal integrated circuits are also susceptible to single-event effects, but they have rarely been tested. Analog circuit single-particle transients require modified test techniques and data analysis. Existing work is reviewed and future concerns are outlined.
- OSTI ID:
- 242437
- Journal Information:
- IEEE Transactions on Nuclear Science, Vol. 43, Issue 2; Other Information: PBD: Apr 1996
- Country of Publication:
- United States
- Language:
- English
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