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Title: Single-event effects experienced by astronauts and microelectronic circuits flown in space

Abstract

Models developed for explaining the light flashes experienced by astronauts on Apollo and Skylab missions were used with slight modification to explain upsets observed in microelectronic circuits. Both phenomena can be explained by the simple assumption that an event occurs whenever a threshold number of ionizations or isomerizations are generated within a sensitive volume. Evidence is consistent with the threshold being sharp in both cases, but fluctuations in the physical stimuli lead to a gradual rather than sharp increase in cross section with LET. Successful use of the model requires knowledge of the dimensions of the sensitive volume and the value of threshold. Techniques have been developed to determine these SEU parameters in modern circuits.

Authors:
 [1]
  1. Clemson Univ., SC (United States). Dept. of Physics and Astronomy
Publication Date:
OSTI Identifier:
242428
Resource Type:
Journal Article
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 43; Journal Issue: 2; Other Information: PBD: Apr 1996
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; 56 BIOLOGY AND MEDICINE, APPLIED STUDIES; ASTRONAUTS; BIOLOGICAL RADIATION EFFECTS; MICROELECTRONIC CIRCUITS; PHYSICAL RADIATION EFFECTS; SPACE FLIGHT; EYES; MATHEMATICAL MODELS; IONIZING RADIATIONS

Citation Formats

McNulty, P.J. Single-event effects experienced by astronauts and microelectronic circuits flown in space. United States: N. p., 1996. Web. doi:10.1109/23.490894.
McNulty, P.J. Single-event effects experienced by astronauts and microelectronic circuits flown in space. United States. doi:10.1109/23.490894.
McNulty, P.J. Mon . "Single-event effects experienced by astronauts and microelectronic circuits flown in space". United States. doi:10.1109/23.490894.
@article{osti_242428,
title = {Single-event effects experienced by astronauts and microelectronic circuits flown in space},
author = {McNulty, P.J.},
abstractNote = {Models developed for explaining the light flashes experienced by astronauts on Apollo and Skylab missions were used with slight modification to explain upsets observed in microelectronic circuits. Both phenomena can be explained by the simple assumption that an event occurs whenever a threshold number of ionizations or isomerizations are generated within a sensitive volume. Evidence is consistent with the threshold being sharp in both cases, but fluctuations in the physical stimuli lead to a gradual rather than sharp increase in cross section with LET. Successful use of the model requires knowledge of the dimensions of the sensitive volume and the value of threshold. Techniques have been developed to determine these SEU parameters in modern circuits.},
doi = {10.1109/23.490894},
journal = {IEEE Transactions on Nuclear Science},
number = 2,
volume = 43,
place = {United States},
year = {1996},
month = {4}
}