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Title: Single-event effects in avionics

Abstract

The occurrence of single-event upset (SEU) in aircraft electronics has evolved from a series of interesting anecdotal incidents to accepted fact. A study completed in 1992 demonstrated that SEU`s are real, that the measured in-flight rates correlate with the atmospheric neutron flux, and that the rates can be calculated using laboratory SEU data. Once avionics DEU was shown to be an actual effect, it had to be dealt with in avionics designs. The major concern is in random access memories (RAM`s), both static (SRAM`s) and dynamic (DRAM`s), because these microelectronic devices contain the largest number of bits, but other parts, such as microprocessors, are also potentially susceptible to upset. In addition, other single-event effects (SEE`s), specifically latch-up and burnout, can also be induced by atmospheric neutrons.

Authors:
 [1]
  1. Boeing Defense and Space Group, Seattle, WA (United States)
Publication Date:
OSTI Identifier:
242427
Resource Type:
Journal Article
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 43; Journal Issue: 2; Other Information: PBD: Apr 1996
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; ELECTRONIC EQUIPMENT; PHYSICAL RADIATION EFFECTS; AIRCRAFT; IONIZING RADIATIONS; SEMICONDUCTOR STORAGE DEVICES; EARTH ATMOSPHERE; NEUTRONS; PROTONS; HEAVY IONS

Citation Formats

Normand, E. Single-event effects in avionics. United States: N. p., 1996. Web. doi:10.1109/23.490893.
Normand, E. Single-event effects in avionics. United States. doi:10.1109/23.490893.
Normand, E. Mon . "Single-event effects in avionics". United States. doi:10.1109/23.490893.
@article{osti_242427,
title = {Single-event effects in avionics},
author = {Normand, E.},
abstractNote = {The occurrence of single-event upset (SEU) in aircraft electronics has evolved from a series of interesting anecdotal incidents to accepted fact. A study completed in 1992 demonstrated that SEU`s are real, that the measured in-flight rates correlate with the atmospheric neutron flux, and that the rates can be calculated using laboratory SEU data. Once avionics DEU was shown to be an actual effect, it had to be dealt with in avionics designs. The major concern is in random access memories (RAM`s), both static (SRAM`s) and dynamic (DRAM`s), because these microelectronic devices contain the largest number of bits, but other parts, such as microprocessors, are also potentially susceptible to upset. In addition, other single-event effects (SEE`s), specifically latch-up and burnout, can also be induced by atmospheric neutrons.},
doi = {10.1109/23.490893},
journal = {IEEE Transactions on Nuclear Science},
number = 2,
volume = 43,
place = {United States},
year = {1996},
month = {4}
}