Anisotropic electrical properties of NiO x /β-Ga 2 O 3 p-n heterojunctions on (2̅01), (001), and (010) crystal orientations
Journal Article
·
· Applied Physics Express
- OSTI
Abstract
NiOx/β-Ga2O3p-nheterojunctions fabricated on and β-Ga2O3substrates show distinctly anisotropic electrical properties. All three devices exhibited excellent rectification ≥109, and turn-on voltages >2.0 V. The device showed very different turn-on voltage, specific on-resistance, and reverse recovery time compared with and devices. Moreover, it is calculated that the interface trap state densities for and plane devices are 4.3 × 1010, 7.4 × 1010, and 1.6 × 1011eV–1cm–2, respectively. These differences in the NiOx/β-Ga2O3heterojunctions are attributed to the different atomic configurations, the density of dangling bonds, and interface trap state densities.
- Research Organization:
- Arizona State Univ., Tempe, AZ (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- SC0021230
- OSTI ID:
- 2421819
- Journal Information:
- Applied Physics Express, Journal Name: Applied Physics Express Journal Issue: 9 Vol. 16; ISSN 1882-0778
- Publisher:
- Japan Society of Applied Physics
- Country of Publication:
- United States
- Language:
- English
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