Quasi-Nondestructive Read Out of Ferroelectric Capacitor Polarization by Exploiting a 2TnC Cell to Relax the Endurance Requirement

Xiao, Yi; Deng, Shan; Zhao, Zijian; Faris, Zubair; Xu, Yixin; Huang, Tzu-Jung; Narayanan, Vijaykrishnan; Ni, Kai

doi:10.1109/led.2023.3290940

Quasi-Nondestructive Read Out of Ferroelectric Capacitor Polarization by Exploiting a 2TnC Cell to Relax the Endurance Requirement

Journal Article · 01 September 2023 · IEEE Electron Device Letters

DOI:https://doi.org/10.1109/led.2023.3290940· OSTI ID:2421736

^[1]; ^[2]; ^[2]; Faris, Zubair ^[3]; ^[1]; Huang, Tzu-Jung ^[2]; ^[1]; ^[3]

Department of Computer Science and Engineering, The Penn State University, University Park, PA, USA
Microsystems Engineering Ph.D. Program, Rochester Institute of Technology, Rochester, NY, USA
Department of Electrical and Microelectronic Engineering, Rochester Institute of Technology, Rochester, NY, USA

Not provided.

View Accepted Manuscript (DOE)

Research Organization:: Pennsylvania State Univ., University Park, PA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: SC0021118

OSTI ID:: 2421736

Journal Information:: IEEE Electron Device Letters, Journal Name: IEEE Electron Device Letters Journal Issue: 9 Vol. 44; ISSN 0741-3106

Publisher:: IEEECopyright Statement

Country of Publication:: United States

Language:: English

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