ToF-SIMS Depth Profiling to Measure Nanoparticle and Polymer Diffusion in Polymer Melts

Wang, Kaitlin; Composto, Russell J.; Winey, Karen I.

doi:10.1021/acs.macromol.3c00033

ToF-SIMS Depth Profiling to Measure Nanoparticle and Polymer Diffusion in Polymer Melts

Journal Article · 16 March 2023 · Macromolecules

DOI:https://doi.org/10.1021/acs.macromol.3c00033· OSTI ID:2420509

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Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States; OSTI
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States; Department of Chemical and Biomolecular Engineering, Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States

Not provided.

Research Organization:: Univ. of Pennsylvania, Philadelphia, PA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0016421

OSTI ID:: 2420509

Journal Information:: Macromolecules, Journal Name: Macromolecules Journal Issue: 6 Vol. 56; ISSN 0024-9297

Publisher:: American Chemical Society

Country of Publication:: United States

Language:: English

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