Small-Signal Angle Stability-Oriented False Data Injection Cyber-Attacks on Power Systems
Journal Article
·
· IEEE Transactions on Smart Grid
- Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, SAR, China; OSTI
- Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, SAR, China
- Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL, USA
Not provided.
- Research Organization:
- Univ. of Central Florida, Orlando, FL (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- DOE Contract Number:
- EE0009339
- OSTI ID:
- 2418787
- Journal Information:
- IEEE Transactions on Smart Grid, Journal Name: IEEE Transactions on Smart Grid Journal Issue: 1 Vol. 14; ISSN 1949-3053
- Publisher:
- IEEE
- Country of Publication:
- United States
- Language:
- English
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