Interface Engineering by Intermediate Hydrogen Plasma Treatment Using Dc-PECVD for Silicon Heterojunction Solar Cells
Journal Article
·
· ACS Applied Electronic Materials
- Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware19716, United States; Institute of Energy Conversion, University of Delaware, Newark, Delaware19716, United States; OSTI
- Institute of Energy Conversion, University of Delaware, Newark, Delaware19716, United States
- Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware19716, United States; Institute of Energy Conversion, University of Delaware, Newark, Delaware19716, United States
Not provided.
- Research Organization:
- Univ. of Delaware, Newark, DE (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- DOE Contract Number:
- EE0007534
- OSTI ID:
- 2418507
- Journal Information:
- ACS Applied Electronic Materials, Journal Name: ACS Applied Electronic Materials Journal Issue: 2 Vol. 5; ISSN 2637-6113
- Publisher:
- ACS Publications
- Country of Publication:
- United States
- Language:
- English
Similar Records
Correlation between in Situ Diagnostics of the Hydrogen Plasma and the Interface Passivation Quality of Hydrogen Plasma Post-Treated a-Si:H in Silicon Heterojunction Solar Cells
Nanosecond Pulsed Laser Patterning of Interdigitated Back Contact Heterojunction Silicon Solar Cells
Electroluminescence analysis for spatial characterization of parasitic optical losses in silicon heterojunction solar cells
Journal Article
·
2019
· ACS Applied Materials and Interfaces
·
OSTI ID:1613434
Nanosecond Pulsed Laser Patterning of Interdigitated Back Contact Heterojunction Silicon Solar Cells
Journal Article
·
2020
· IEEE Journal of Photovoltaics
·
OSTI ID:1848518
Electroluminescence analysis for spatial characterization of parasitic optical losses in silicon heterojunction solar cells
Journal Article
·
2018
· Journal of Applied Physics
·
OSTI ID:1433044