Efficacy of Spatial and Temporal RHBD Techniques at Advanced Bulk FinFET Technology Nodes

Xiong, Yoni; Pieper, Nicholas J.; Narasimham, Balaji; Ball, Dennis R.; Bhuva, Bharat L.

doi:10.1109/tns.2023.3246067

Efficacy of Spatial and Temporal RHBD Techniques at Advanced Bulk FinFET Technology Nodes

Journal Article · 01 August 2023 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/tns.2023.3246067· OSTI ID:2417930

^[1]; ^[2]; Narasimham, Balaji ^[3]; Ball, Dennis R. ^[2]; ^[2]

Electrical and Computer Engineering Department, Vanderbilt University, Nashville, TN, USA; OSTI
Electrical and Computer Engineering Department, Vanderbilt University, Nashville, TN, USA
Broadcom Inc., San Jose, CA, USA

Not provided.

Research Organization:: Krell Institute, Ames, IA (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: NA0003960

OSTI ID:: 2417930

Journal Information:: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 8 Vol. 70; ISSN 0018-9499

Publisher:: IEEE

Country of Publication:: United States

Language:: English

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