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U.S. Department of Energy
Office of Scientific and Technical Information
 

X-ray wavefront sensor development at the Advanced Light Source

Conference ·
DOI:https://doi.org/10.1117/12.2679136· OSTI ID:2335728
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At Lawrence Berkeley National Laboratory's Advanced Light Source, we are developing x-ray wavefront sensors to support the creation and operation of beamlines with diffraction-limited quality. Our new approach to rapid, intermittent wavefront sensing operates in reflection at glancing incidence angles and is compatible with the high-power densities of modern beamlines. For soft x-ray applications especially, the wavefront sensor can operate upstream of the exit slit in a vertically dispersed beam. This single-shot technique supports lateral shearing interferometry and Hartmann wavefront sensing; it can be adapted to speckle-based techniques as well. The reflected beam is directed to an off-axis YAG crystal that produces scintillated visible light. A small mirror reflects the light to a microscope and camera, and the measured wavefront shape information can be used as feedback to adaptive x-ray mirror elements. A compact array of gratings enables measurement across a broad range of photon energies or wavefront curvatures. We describe recent demonstrations at soft x-ray and hard x-ray wavelengths measuring an adaptive x-ray mirror, and a toroidal focusing mirror.

Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Accelerator R&D and Production (ARDAP) (SC-ARDAP)
DOE Contract Number:
AC02-05CH11231
OSTI ID:
2335728
Resource Relation:
Conference: Proceedings of SPIE--the International Society for Optical Engineering
Country of Publication:
United States
Language:
English

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