Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Capacitance Transients, Photoconductive Decay, and Impedance Spectroscopy on 19% to 22% Efficient Silicon Solar Cells

Conference ·

High efficiency silicon solar cells are characterized using current-voltage curves, electroluminescence imaging, impedance spectroscopy, capacitance transients, microwave photoconductive decay, and time-resolved photoluminescence imaging. The sample set is composed of cells from different manufacturers and includes an n-type silicon heterojunction (SHJ), an n-type passivated emitter rear totally diffused (PERT), and five different p-type passivated emitter rear contact (PERC) cells. Carrier lifetimes, both photoconductivity and photoluminescence, are measured co-located with the light excitation pulse and within the cell but away from the light spot. Luminescence intensity and excess carrier lifetimes correlate to cell voltage. The capacitance transient time constants correlate to the capacitance values extracted from impedance spectroscopy.

Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
DOE Contract Number:
AC36-08GO28308; AC36-08GO28308
OSTI ID:
2309699
Report Number(s):
NREL/CP-5K00-86468; MainId:87241; UUID:6c61a03c-ad1f-415e-b6d5-0d574db420b4; MainAdminId:71861
Country of Publication:
United States
Language:
English

References (11)

Applicability of Light Induced Luminescence for Characterization of Internal Series-Parallel Connected Photovoltaic Modules journal May 2022
Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence journal June 2005
Impedance spectroscopy characterization of c-Si solar cells with SiOx/ Poly-Si rear passivating contacts journal March 2023
Comparison of photovoltaic module luminescence imaging techniques: Assessing the influence of lateral currents in high-efficiency device structures journal April 2019
Admittance spectra of silicon photocells in dark mode journal November 2021
Impedance spectroscopy of monocrystalline silicon solar cells for photosensor applications: Highly sensitive device journal November 2020
Investigation of solar cell degradation using electrochemical impedance spectroscopy journal May 2020
Imaging Lateral Drift Kinetics to Understand Causes of Outdoor Degradation in Silicon Heterojunction Photovoltaic Modules journal May 2019
Photoluminescence imaging of silicon wafers journal July 2006
Contactless electroluminescence imaging for cell and module characterization conference June 2015
Fast Photoluminescence Imaging of Silicon Wafers conference May 2006