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Title: Single Analyzer Precursor Ion Scans in a Linear Quadrupole Ion Trap Using Orthogonal Double Resonance Excitation

Abstract

Reported herein is a simple method of performing single analyzer precursor ion scans in a linear quadrupole ion trap using orthogonal double resonance excitation. A first supplementary AC signal applied to the y electrodes is scanned through ion secular frequencies in order to mass-selectively excite precursor ions while, simultaneously, a second fixed-frequency AC signal is applied orthogonally on the x electrodes in order to eject product ions of selected mass-to-charge ratios towards the detector. The two AC signals are applied orthogonally so as to preclude the possibility of (1) inadvertently ejecting precursor ions into the detector, which results in artifact peaks, and (2) prevent beat frequencies on the x electrodes from ejecting ions off-resonance. Precursor ion scans are implemented while using the inverse Mathieu q scan for easier mass calibration. The orthogonal double resonance experiment results in single ion trap precursor scans with far less intense artifact peaks than when both AC signals are applied to the same electrodes, paving the way for implementation of neutral loss scanning in single ion trap mass spectrometers. .

Authors:
;  [1]
  1. Purdue University, Department of Chemistry (United States)
Publication Date:
OSTI Identifier:
22776906
Resource Type:
Journal Article
Journal Name:
Journal of the American Society for Mass Spectrometry
Additional Journal Information:
Journal Volume: 28; Journal Issue: 9; Other Information: Copyright (c) 2017 American Society for Mass Spectrometry; http://www.springer-ny.com; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1044-0305
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CALIBRATION; ELECTRODES; EXCITATION; IONS; MASS; MASS SPECTROMETERS; QUADRUPOLES; RESONANCE; SIGNALS; TRAPS

Citation Formats

Snyder, Dalton T., and Cooks, R. Graham, E-mail: cooks@purdue.edu. Single Analyzer Precursor Ion Scans in a Linear Quadrupole Ion Trap Using Orthogonal Double Resonance Excitation. United States: N. p., 2017. Web. doi:10.1007/S13361-017-1707-Y.
Snyder, Dalton T., & Cooks, R. Graham, E-mail: cooks@purdue.edu. Single Analyzer Precursor Ion Scans in a Linear Quadrupole Ion Trap Using Orthogonal Double Resonance Excitation. United States. doi:10.1007/S13361-017-1707-Y.
Snyder, Dalton T., and Cooks, R. Graham, E-mail: cooks@purdue.edu. Fri . "Single Analyzer Precursor Ion Scans in a Linear Quadrupole Ion Trap Using Orthogonal Double Resonance Excitation". United States. doi:10.1007/S13361-017-1707-Y.
@article{osti_22776906,
title = {Single Analyzer Precursor Ion Scans in a Linear Quadrupole Ion Trap Using Orthogonal Double Resonance Excitation},
author = {Snyder, Dalton T. and Cooks, R. Graham, E-mail: cooks@purdue.edu},
abstractNote = {Reported herein is a simple method of performing single analyzer precursor ion scans in a linear quadrupole ion trap using orthogonal double resonance excitation. A first supplementary AC signal applied to the y electrodes is scanned through ion secular frequencies in order to mass-selectively excite precursor ions while, simultaneously, a second fixed-frequency AC signal is applied orthogonally on the x electrodes in order to eject product ions of selected mass-to-charge ratios towards the detector. The two AC signals are applied orthogonally so as to preclude the possibility of (1) inadvertently ejecting precursor ions into the detector, which results in artifact peaks, and (2) prevent beat frequencies on the x electrodes from ejecting ions off-resonance. Precursor ion scans are implemented while using the inverse Mathieu q scan for easier mass calibration. The orthogonal double resonance experiment results in single ion trap precursor scans with far less intense artifact peaks than when both AC signals are applied to the same electrodes, paving the way for implementation of neutral loss scanning in single ion trap mass spectrometers. .},
doi = {10.1007/S13361-017-1707-Y},
journal = {Journal of the American Society for Mass Spectrometry},
issn = {1044-0305},
number = 9,
volume = 28,
place = {United States},
year = {2017},
month = {9}
}