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Title: Pixel quality evaluation and correction procedures in electronic speckle pattern interferometry

Abstract

No abstract prepared.

Authors:
;  [1]
  1. University of British Columbia, Department of Mechanical Engineering (Canada)
Publication Date:
OSTI Identifier:
22771707
Resource Type:
Journal Article
Journal Name:
Experimental Techniques
Additional Journal Information:
Journal Volume: 35; Journal Issue: 5; Other Information: Copyright (c) 2010 Society for Experimental Mechanics, Inc.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0732-8818
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CORRECTIONS; EVALUATION; INTERFEROMETRY

Citation Formats

An, Y., and Schajer, G. S., E-mail: schajer@mech.ubc.ca. Pixel quality evaluation and correction procedures in electronic speckle pattern interferometry. United States: N. p., 2011. Web. doi:10.1111/J.1747-1567.2010.00621.X.
An, Y., & Schajer, G. S., E-mail: schajer@mech.ubc.ca. Pixel quality evaluation and correction procedures in electronic speckle pattern interferometry. United States. doi:10.1111/J.1747-1567.2010.00621.X.
An, Y., and Schajer, G. S., E-mail: schajer@mech.ubc.ca. Thu . "Pixel quality evaluation and correction procedures in electronic speckle pattern interferometry". United States. doi:10.1111/J.1747-1567.2010.00621.X.
@article{osti_22771707,
title = {Pixel quality evaluation and correction procedures in electronic speckle pattern interferometry},
author = {An, Y. and Schajer, G. S., E-mail: schajer@mech.ubc.ca},
abstractNote = {No abstract prepared.},
doi = {10.1111/J.1747-1567.2010.00621.X},
journal = {Experimental Techniques},
issn = {0732-8818},
number = 5,
volume = 35,
place = {United States},
year = {2011},
month = {9}
}