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Title: Photodielectric Processes in ZnS : Cu Polycrystalline Layers

Abstract

The frequency dependences of dielectric parameters of zinc sulfide electroluminescent polycrystalline structures doped with copper are studied in the dark and under light excitation in the visible wavelength range. A positive photodielectric effect most pronounced in the low-frequency range was revealed. The experimental results are explained within framework of formation of a space charge in the bulk of a semiconductor. The analysis of data indicates they can be correlated with luminance characteristics of an electroluminescent layer.

Authors:
;  [1]; ;  [2]
  1. Herzen State Pedagogical University of Russia (Russian Federation)
  2. St. Petersburg State Technological Institute (Technical University) (Russian Federation)
Publication Date:
OSTI Identifier:
22771449
Resource Type:
Journal Article
Journal Name:
Physics of the Solid State
Additional Journal Information:
Journal Volume: 60; Journal Issue: 2; Other Information: Copyright (c) 2018 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7834
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COPPER ADDITIONS; DATA ANALYSIS; DIELECTRIC MATERIALS; DOPED MATERIALS; ELECTROLUMINESCENCE; EXCITATION; FREQUENCY DEPENDENCE; LAYERS; POLYCRYSTALS; SEMICONDUCTOR MATERIALS; SPACE CHARGE; VISIBLE RADIATION; WAVELENGTHS; ZINC SULFIDES

Citation Formats

Avanesyan, V. T., E-mail: avanesyan@mail.ru, Rakina, A. V., Pak, V. G., and Sychev, M. M. Photodielectric Processes in ZnS : Cu Polycrystalline Layers. United States: N. p., 2018. Web. doi:10.1134/S1063783418020051.
Avanesyan, V. T., E-mail: avanesyan@mail.ru, Rakina, A. V., Pak, V. G., & Sychev, M. M. Photodielectric Processes in ZnS : Cu Polycrystalline Layers. United States. doi:10.1134/S1063783418020051.
Avanesyan, V. T., E-mail: avanesyan@mail.ru, Rakina, A. V., Pak, V. G., and Sychev, M. M. Thu . "Photodielectric Processes in ZnS : Cu Polycrystalline Layers". United States. doi:10.1134/S1063783418020051.
@article{osti_22771449,
title = {Photodielectric Processes in ZnS : Cu Polycrystalline Layers},
author = {Avanesyan, V. T., E-mail: avanesyan@mail.ru and Rakina, A. V. and Pak, V. G. and Sychev, M. M.},
abstractNote = {The frequency dependences of dielectric parameters of zinc sulfide electroluminescent polycrystalline structures doped with copper are studied in the dark and under light excitation in the visible wavelength range. A positive photodielectric effect most pronounced in the low-frequency range was revealed. The experimental results are explained within framework of formation of a space charge in the bulk of a semiconductor. The analysis of data indicates they can be correlated with luminance characteristics of an electroluminescent layer.},
doi = {10.1134/S1063783418020051},
journal = {Physics of the Solid State},
issn = {1063-7834},
number = 2,
volume = 60,
place = {United States},
year = {2018},
month = {2}
}