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Title: Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant

Abstract

Single-layer Fe{sub x}Ni{sub 1-x} thin magnetic films have been investigated by the spin-wave resonance technique in the entire concentration range. The surface anisotropy and exchange stiffness constants for the films with a Ni content from 30 to 80 at % have been measured from the experimental standing spin wave spectra. The surface exchange spin wave penetration depth δ{sub C} = 20–30 nm has been determined from the dependences of the surface anisotropy and exchange coupling constants on the Fe{sub 20}Ni{sub 80} film thickness in the range of 250–400 nm.

Authors:
; ;  [1]
  1. Siberian Branch, Russian Academy of Sciences, Kirensky Institute of Physics (Russian Federation)
Publication Date:
OSTI Identifier:
22771445
Resource Type:
Journal Article
Journal Name:
Physics of the Solid State
Additional Journal Information:
Journal Volume: 60; Journal Issue: 2; Other Information: Copyright (c) 2018 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7834
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANISOTROPY; BINARY ALLOY SYSTEMS; CONCENTRATION RATIO; COUPLING CONSTANTS; FLEXIBILITY; IRON COMPOUNDS; LAYERS; NICKEL COMPOUNDS; PENETRATION DEPTH; RESONANCE; SPECTRA; SPIN WAVES; SURFACES; THICKNESS; THIN FILMS

Citation Formats

Vazhenina, I. G., E-mail: irina-vazhenina@mail.ru, Iskhakov, R. S., and Chekanova, L. A. Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant. United States: N. p., 2018. Web. doi:10.1134/S1063783418020294.
Vazhenina, I. G., E-mail: irina-vazhenina@mail.ru, Iskhakov, R. S., & Chekanova, L. A. Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant. United States. doi:10.1134/S1063783418020294.
Vazhenina, I. G., E-mail: irina-vazhenina@mail.ru, Iskhakov, R. S., and Chekanova, L. A. Thu . "Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant". United States. doi:10.1134/S1063783418020294.
@article{osti_22771445,
title = {Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant},
author = {Vazhenina, I. G., E-mail: irina-vazhenina@mail.ru and Iskhakov, R. S. and Chekanova, L. A.},
abstractNote = {Single-layer Fe{sub x}Ni{sub 1-x} thin magnetic films have been investigated by the spin-wave resonance technique in the entire concentration range. The surface anisotropy and exchange stiffness constants for the films with a Ni content from 30 to 80 at % have been measured from the experimental standing spin wave spectra. The surface exchange spin wave penetration depth δ{sub C} = 20–30 nm has been determined from the dependences of the surface anisotropy and exchange coupling constants on the Fe{sub 20}Ni{sub 80} film thickness in the range of 250–400 nm.},
doi = {10.1134/S1063783418020294},
journal = {Physics of the Solid State},
issn = {1063-7834},
number = 2,
volume = 60,
place = {United States},
year = {2018},
month = {2}
}