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Title: Anomalous Dependence of the Intensity of X-Ray Reflections of Cs{sub 2}SO{sub 4} on the Crystallite Size and Shape

Abstract

Detailed X-ray and electron microscopy analyses of Cs{sub 2}SO{sub 4} powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retained in accordance with the PDF-2 database. Electron microscopy microdiffraction investigations of the orientation of developed surfaces of platelike crystallites revealed four different directions; however, these directions could not provide texture amplification of a number of observed (hkl) reflections. It is suggested that the intensity redistribution is based on the sphericity of X-ray waves incident on the sample.

Authors:
; ;  [1]
  1. Russian Academy of Sciences, Institute of Solid State Physics (Russian Federation)
Publication Date:
OSTI Identifier:
22771431
Resource Type:
Journal Article
Journal Name:
Physics of the Solid State
Additional Journal Information:
Journal Volume: 60; Journal Issue: 2; Other Information: Copyright (c) 2018 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7834
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; AMPLIFICATION; CESIUM SULFATES; DIFFRACTION; DISTRIBUTION; ELECTRON MICROSCOPY; ORIENTATION; POWDERS; REFLECTION; SURFACES; TEXTURE; X RADIATION; X-RAY EMISSION ANALYSIS

Citation Formats

Shmyt’ko, I. M., E-mail: shim@issp.ac.ru, Kedrov, V. V., and Aronin, A. S.. Anomalous Dependence of the Intensity of X-Ray Reflections of Cs{sub 2}SO{sub 4} on the Crystallite Size and Shape. United States: N. p., 2018. Web. doi:10.1134/S1063783418020269.
Shmyt’ko, I. M., E-mail: shim@issp.ac.ru, Kedrov, V. V., & Aronin, A. S.. Anomalous Dependence of the Intensity of X-Ray Reflections of Cs{sub 2}SO{sub 4} on the Crystallite Size and Shape. United States. doi:10.1134/S1063783418020269.
Shmyt’ko, I. M., E-mail: shim@issp.ac.ru, Kedrov, V. V., and Aronin, A. S.. Thu . "Anomalous Dependence of the Intensity of X-Ray Reflections of Cs{sub 2}SO{sub 4} on the Crystallite Size and Shape". United States. doi:10.1134/S1063783418020269.
@article{osti_22771431,
title = {Anomalous Dependence of the Intensity of X-Ray Reflections of Cs{sub 2}SO{sub 4} on the Crystallite Size and Shape},
author = {Shmyt’ko, I. M., E-mail: shim@issp.ac.ru and Kedrov, V. V. and Aronin, A. S.},
abstractNote = {Detailed X-ray and electron microscopy analyses of Cs{sub 2}SO{sub 4} powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retained in accordance with the PDF-2 database. Electron microscopy microdiffraction investigations of the orientation of developed surfaces of platelike crystallites revealed four different directions; however, these directions could not provide texture amplification of a number of observed (hkl) reflections. It is suggested that the intensity redistribution is based on the sphericity of X-ray waves incident on the sample.},
doi = {10.1134/S1063783418020269},
journal = {Physics of the Solid State},
issn = {1063-7834},
number = 2,
volume = 60,
place = {United States},
year = {2018},
month = {2}
}