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Title: Theoretical Approach to Energy Resolution of Semiconductor Detectors

Abstract

All processes occurring in semiconductor detectors during detection of primary monoenergetic particles lead to broadening of spectral lines. In this work, a general expression for the energy resolution of semiconductor detectors is obtained using the theory of branching cascade processes. It is shown that the general formula involves all contributions to the spectral line broadening described in the literature and additional contributions associated with fluctuations of electron and hole lifetimes caused by inhomogeneity of traps in the semiconductor material and fluctuations of the electronic channel gain.

Authors:
 [1]
  1. National Research Nuclear University MEPhI (Moscow Engineering Physics Institute) (Russian Federation)
Publication Date:
OSTI Identifier:
22760235
Resource Type:
Journal Article
Journal Name:
Physics of Atomic Nuclei
Additional Journal Information:
Journal Volume: 80; Journal Issue: 9; Other Information: Copyright (c) 2017 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7788
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BRANCHING RATIO; ELECTRONS; ENERGY RESOLUTION; FLUCTUATIONS; GAIN; HOLES; LINE BROADENING; SEMICONDUCTOR DETECTORS; SIGNALS; X RADIATION

Citation Formats

Samedov, V. V., E-mail: v-samedov@yandex.ru. Theoretical Approach to Energy Resolution of Semiconductor Detectors. United States: N. p., 2017. Web. doi:10.1134/S1063778817090125.
Samedov, V. V., E-mail: v-samedov@yandex.ru. Theoretical Approach to Energy Resolution of Semiconductor Detectors. United States. doi:10.1134/S1063778817090125.
Samedov, V. V., E-mail: v-samedov@yandex.ru. Fri . "Theoretical Approach to Energy Resolution of Semiconductor Detectors". United States. doi:10.1134/S1063778817090125.
@article{osti_22760235,
title = {Theoretical Approach to Energy Resolution of Semiconductor Detectors},
author = {Samedov, V. V., E-mail: v-samedov@yandex.ru},
abstractNote = {All processes occurring in semiconductor detectors during detection of primary monoenergetic particles lead to broadening of spectral lines. In this work, a general expression for the energy resolution of semiconductor detectors is obtained using the theory of branching cascade processes. It is shown that the general formula involves all contributions to the spectral line broadening described in the literature and additional contributions associated with fluctuations of electron and hole lifetimes caused by inhomogeneity of traps in the semiconductor material and fluctuations of the electronic channel gain.},
doi = {10.1134/S1063778817090125},
journal = {Physics of Atomic Nuclei},
issn = {1063-7788},
number = 9,
volume = 80,
place = {United States},
year = {2017},
month = {12}
}