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Title: Spectrometer of Synchrotron Radiation Based on Diffraction Focusing a Divergent Beam Formed by a Compound Refractive Lens

Abstract

The results of the first experimental realization of a spectrometer based on the effect of diffraction focusing of X rays by a flat single crystal are discussed. A secondary X-ray source with a relatively high angular divergence and small sizes was formed at the focus of a compound refractive lens having 50 beryllium biconcave elements with a curvature radius of 50 μm. The silicon spectrometer crystal was cut in the form of a wedge of variable thickness, oriented perpendicular to the diffraction plane. The reflection 111 was used for energies of 8.3 and 12 keV. To simulate the experiment, a computer program was developed, which takes into account accurately and for the first time the focusing of radiation by the lens and its subsequent diffraction in the crystal. A calculated curve for a monochromatic beam has made it possible to determine the monochromator spectrum with high resolution from experimental data for a polychromatic beam. It is shown that monochromator resolution increases with an increase in the distance from the compound refractive lens to the crystal.

Authors:
 [1];  [2];  [3];  [4]
  1. National Research Centre “Kurchatov Institute,” (Russian Federation)
  2. Russian Academy of Sciences, Institute of Solid State Physics (Russian Federation)
  3. European Synchrotron Radiation Facility (France)
  4. I. Kant Baltic Federal University (Russian Federation)
Publication Date:
OSTI Identifier:
22758223
Resource Type:
Journal Article
Journal Name:
Crystallography Reports
Additional Journal Information:
Journal Volume: 63; Journal Issue: 4; Other Information: Copyright (c) 2018 Pleiades Publishing, Inc.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7745
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BEAMS; BERYLLIUM; COMPUTER CODES; MONOCHROMATIC RADIATION; MONOCHROMATORS; MONOCRYSTALS; RESOLUTION; SILICON; SPECTRA; SPECTROMETERS; SYNCHROTRON RADIATION; THICKNESS; X-RAY DIFFRACTION; X-RAY SOURCES

Citation Formats

Kohn, V. G., Smirnova, I. A., E-mail: irina@issp.ac.ru, Snigireva, I. I., and Snigirev, A. A. Spectrometer of Synchrotron Radiation Based on Diffraction Focusing a Divergent Beam Formed by a Compound Refractive Lens. United States: N. p., 2018. Web. doi:10.1134/S1063774518040119.
Kohn, V. G., Smirnova, I. A., E-mail: irina@issp.ac.ru, Snigireva, I. I., & Snigirev, A. A. Spectrometer of Synchrotron Radiation Based on Diffraction Focusing a Divergent Beam Formed by a Compound Refractive Lens. United States. doi:10.1134/S1063774518040119.
Kohn, V. G., Smirnova, I. A., E-mail: irina@issp.ac.ru, Snigireva, I. I., and Snigirev, A. A. Sun . "Spectrometer of Synchrotron Radiation Based on Diffraction Focusing a Divergent Beam Formed by a Compound Refractive Lens". United States. doi:10.1134/S1063774518040119.
@article{osti_22758223,
title = {Spectrometer of Synchrotron Radiation Based on Diffraction Focusing a Divergent Beam Formed by a Compound Refractive Lens},
author = {Kohn, V. G. and Smirnova, I. A., E-mail: irina@issp.ac.ru and Snigireva, I. I. and Snigirev, A. A.},
abstractNote = {The results of the first experimental realization of a spectrometer based on the effect of diffraction focusing of X rays by a flat single crystal are discussed. A secondary X-ray source with a relatively high angular divergence and small sizes was formed at the focus of a compound refractive lens having 50 beryllium biconcave elements with a curvature radius of 50 μm. The silicon spectrometer crystal was cut in the form of a wedge of variable thickness, oriented perpendicular to the diffraction plane. The reflection 111 was used for energies of 8.3 and 12 keV. To simulate the experiment, a computer program was developed, which takes into account accurately and for the first time the focusing of radiation by the lens and its subsequent diffraction in the crystal. A calculated curve for a monochromatic beam has made it possible to determine the monochromator spectrum with high resolution from experimental data for a polychromatic beam. It is shown that monochromator resolution increases with an increase in the distance from the compound refractive lens to the crystal.},
doi = {10.1134/S1063774518040119},
journal = {Crystallography Reports},
issn = {1063-7745},
number = 4,
volume = 63,
place = {United States},
year = {2018},
month = {7}
}