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Title: Investigation of the Far-IR Reflection Spectra of SmS Single Crystals and Polycrystals in the Homogeneity Range

Abstract

The far- and mid-IR reflection spectra of Sm{sub 1+} {sub x}S (x = 0–0.17) samples are recorded and analyzed, as well as their electrical and structural parameters at a temperature of T = 300 K. The bond ionicity in SmS is shown to fall with a decrease in the area of the X-ray coherent scattering region and an increase in the concentration of donor impurities and, consequently, conduction electron concentration. The electrical conductivity of stoichiometric SmS single crystals and polycrystals can be determined with an error of 10% from the IR reflection spectra. Due to the low structural quality of the samples, the electrical conductivity cannot be determined in the case of deviation from stoichiometry.

Authors:
; ; ;  [1]
  1. Ioffe Institute (Russian Federation)
Publication Date:
OSTI Identifier:
22756210
Resource Type:
Journal Article
Journal Name:
Semiconductors
Additional Journal Information:
Journal Volume: 52; Journal Issue: 2; Other Information: Copyright (c) 2018 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7826
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; COHERENT SCATTERING; ELECTRIC CONDUCTIVITY; MONOCRYSTALS; POLYCRYSTALS; REFLECTION; SAMARIUM SULFIDES; SPECTRA; X RADIATION

Citation Formats

Ulashkevich, Yu. V., Kaminskiy, V. V., E-mail: vladimir.kaminski@mail.ioffe.ru, Romanova, M. V., and Sharenkova, N. V. Investigation of the Far-IR Reflection Spectra of SmS Single Crystals and Polycrystals in the Homogeneity Range. United States: N. p., 2018. Web. doi:10.1134/S1063782618020227.
Ulashkevich, Yu. V., Kaminskiy, V. V., E-mail: vladimir.kaminski@mail.ioffe.ru, Romanova, M. V., & Sharenkova, N. V. Investigation of the Far-IR Reflection Spectra of SmS Single Crystals and Polycrystals in the Homogeneity Range. United States. doi:10.1134/S1063782618020227.
Ulashkevich, Yu. V., Kaminskiy, V. V., E-mail: vladimir.kaminski@mail.ioffe.ru, Romanova, M. V., and Sharenkova, N. V. Thu . "Investigation of the Far-IR Reflection Spectra of SmS Single Crystals and Polycrystals in the Homogeneity Range". United States. doi:10.1134/S1063782618020227.
@article{osti_22756210,
title = {Investigation of the Far-IR Reflection Spectra of SmS Single Crystals and Polycrystals in the Homogeneity Range},
author = {Ulashkevich, Yu. V. and Kaminskiy, V. V., E-mail: vladimir.kaminski@mail.ioffe.ru and Romanova, M. V. and Sharenkova, N. V.},
abstractNote = {The far- and mid-IR reflection spectra of Sm{sub 1+} {sub x}S (x = 0–0.17) samples are recorded and analyzed, as well as their electrical and structural parameters at a temperature of T = 300 K. The bond ionicity in SmS is shown to fall with a decrease in the area of the X-ray coherent scattering region and an increase in the concentration of donor impurities and, consequently, conduction electron concentration. The electrical conductivity of stoichiometric SmS single crystals and polycrystals can be determined with an error of 10% from the IR reflection spectra. Due to the low structural quality of the samples, the electrical conductivity cannot be determined in the case of deviation from stoichiometry.},
doi = {10.1134/S1063782618020227},
journal = {Semiconductors},
issn = {1063-7826},
number = 2,
volume = 52,
place = {United States},
year = {2018},
month = {2}
}