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Title: Copper(I) Selenide Thin Films: Composition, Morphology, Structure, and Optical Properties

Abstract

The systematized results of studies of the composition, morphology, structure, optical properties, and conductivity of hydrochemically deposited copper(I) selenide thin films (Cu{sub 1.8}Se) with the thickness of 390–400 nm are reported. The studies are carried out using scanning electron microscopy, energy-dispersive analysis, X-ray diffraction analysis, and X-ray photoelectron spectroscopy. The hole conductivity of the layers is established by the thermopower technique. The optical band gap determined from the results of studies of optical absorbance and diffuse reflection spectra of the films at 298 K is 2.5 and 1.84 eV for direct and indirect optical transitions, respectively.

Authors:
; ;  [1]; ;  [2];  [1]
  1. Ural Federal University named after the First President of Russia B.N. Yeltsin (Russian Federation)
  2. Institute of Solid State Chemistry, Ural Branch, Russian Academy of Sciences (Russian Federation)
Publication Date:
OSTI Identifier:
22749768
Resource Type:
Journal Article
Journal Name:
Semiconductors
Additional Journal Information:
Journal Volume: 52; Journal Issue: 10; Other Information: Copyright (c) 2018 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7826
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; COPPER; MORPHOLOGY; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SELENIDES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY

Citation Formats

Maskaeva, L. N., E-mail: mln@ural.ru, Fedorova, E. A., Markov, V. F., Kuznetsov, M. V., Lipina, O. A., and Pozdin, A. V. Copper(I) Selenide Thin Films: Composition, Morphology, Structure, and Optical Properties. United States: N. p., 2018. Web. doi:10.1134/S1063782618100111.
Maskaeva, L. N., E-mail: mln@ural.ru, Fedorova, E. A., Markov, V. F., Kuznetsov, M. V., Lipina, O. A., & Pozdin, A. V. Copper(I) Selenide Thin Films: Composition, Morphology, Structure, and Optical Properties. United States. doi:10.1134/S1063782618100111.
Maskaeva, L. N., E-mail: mln@ural.ru, Fedorova, E. A., Markov, V. F., Kuznetsov, M. V., Lipina, O. A., and Pozdin, A. V. Mon . "Copper(I) Selenide Thin Films: Composition, Morphology, Structure, and Optical Properties". United States. doi:10.1134/S1063782618100111.
@article{osti_22749768,
title = {Copper(I) Selenide Thin Films: Composition, Morphology, Structure, and Optical Properties},
author = {Maskaeva, L. N., E-mail: mln@ural.ru and Fedorova, E. A. and Markov, V. F. and Kuznetsov, M. V. and Lipina, O. A. and Pozdin, A. V.},
abstractNote = {The systematized results of studies of the composition, morphology, structure, optical properties, and conductivity of hydrochemically deposited copper(I) selenide thin films (Cu{sub 1.8}Se) with the thickness of 390–400 nm are reported. The studies are carried out using scanning electron microscopy, energy-dispersive analysis, X-ray diffraction analysis, and X-ray photoelectron spectroscopy. The hole conductivity of the layers is established by the thermopower technique. The optical band gap determined from the results of studies of optical absorbance and diffuse reflection spectra of the films at 298 K is 2.5 and 1.84 eV for direct and indirect optical transitions, respectively.},
doi = {10.1134/S1063782618100111},
journal = {Semiconductors},
issn = {1063-7826},
number = 10,
volume = 52,
place = {United States},
year = {2018},
month = {10}
}