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Title: Scanning photoelectron microscopy using a pointed capillary probe

Abstract

The possibilities of a new type of scanning probe microscopy (SPM) for two different samples are experimentally demonstrated. The method is based on the use of a pointed capillary, which can simultaneously act as a ‘classical’ SPM probe and also as a controlled thin channel for transporting charged particles emitted by the surface to the detector. In the experiment, photoelectrons pass through a dielectric hollow cone probe with an aperture radius of 1 μm and detected by microchannel plates at different points of the investigated conducting surface irradiated by the second harmonic of a femtosecond Ti : sapphire laser. As a result, the sample’s surface profile is visualised with a subwavelength spatial resolution. This method makes it possible to control spatially localised beams of electrons, ions, neutral atoms (molecules) and soft X-ray radiation, as well as opens a possibility for research in the field of nanoscale photodesorption of molecular ions. (electron microscopy)

Authors:
; ; ;
Publication Date:
OSTI Identifier:
22725962
Resource Type:
Journal Article
Journal Name:
Quantum Electronics (Woodbury, N.Y.)
Additional Journal Information:
Journal Volume: 47; Journal Issue: 8; Other Information: Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7818
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; APERTURES; ATOMIC BEAMS; CAPILLARIES; CHARGED-PARTICLE TRANSPORT; DIELECTRIC MATERIALS; ELECTRON BEAMS; HARMONIC GENERATION; ION BEAMS; LASERS; MICROCHANNEL ELECTRON MULTIPLIERS; MOLECULAR IONS; PHOTOELECTRON SPECTROSCOPY; PROBES; SAPPHIRE; SOFT X RADIATION; SPATIAL RESOLUTION

Citation Formats

Mironov, B. N., Cherkun, A. P., Aseyev, S. A., and Chekalin, S. V. Scanning photoelectron microscopy using a pointed capillary probe. United States: N. p., 2017. Web. doi:10.1070/QEL16331.
Mironov, B. N., Cherkun, A. P., Aseyev, S. A., & Chekalin, S. V. Scanning photoelectron microscopy using a pointed capillary probe. United States. doi:10.1070/QEL16331.
Mironov, B. N., Cherkun, A. P., Aseyev, S. A., and Chekalin, S. V. Fri . "Scanning photoelectron microscopy using a pointed capillary probe". United States. doi:10.1070/QEL16331.
@article{osti_22725962,
title = {Scanning photoelectron microscopy using a pointed capillary probe},
author = {Mironov, B. N. and Cherkun, A. P. and Aseyev, S. A. and Chekalin, S. V.},
abstractNote = {The possibilities of a new type of scanning probe microscopy (SPM) for two different samples are experimentally demonstrated. The method is based on the use of a pointed capillary, which can simultaneously act as a ‘classical’ SPM probe and also as a controlled thin channel for transporting charged particles emitted by the surface to the detector. In the experiment, photoelectrons pass through a dielectric hollow cone probe with an aperture radius of 1 μm and detected by microchannel plates at different points of the investigated conducting surface irradiated by the second harmonic of a femtosecond Ti : sapphire laser. As a result, the sample’s surface profile is visualised with a subwavelength spatial resolution. This method makes it possible to control spatially localised beams of electrons, ions, neutral atoms (molecules) and soft X-ray radiation, as well as opens a possibility for research in the field of nanoscale photodesorption of molecular ions. (electron microscopy)},
doi = {10.1070/QEL16331},
journal = {Quantum Electronics (Woodbury, N.Y.)},
issn = {1063-7818},
number = 8,
volume = 47,
place = {United States},
year = {2017},
month = {9}
}