LiF measurements of N{sub 2}(A{sup 3}{Sigma}{sub u}{sup +}, v=0) decay in a N{sub 2}-O{sub 2} rf pulsed post discharge
- Universita di Bari via Orabona, Bari (Italy)
N{sub 2}/O{sub 2} plasmas are currently investigated under a variety of excitation conditions (microwave, dc, rf) and devices (afterglow, pulsed discharge, jets). The stream of species from such plasma are used for surface treatments of polymers, silicon, steel etc. and for material testing under conditions simulating re-entry problems of space shuttles. The kinetics in N{sub 2}/O{sub 2} plasma discharges is rather complex since, together with N{sub 2}. O{sub 2}, N, O, NO, N{sub 2}O, NO{sub 2} ground state species, numerous excited states are produced. Because of this complexity most of the elementary kinetics have been studied in afterglow conditions selecting as much as possible single reaction channels. Particular attention has been paid to the energy transfer processes between atomic and molecular nitrogen metastable and O{sub 2} and O. N{sub 2}(A,v) + O{sub 2} (or O), giving as main products N{sub 2}O or NO has been one of the most investigated reaction pattern. Then, the branching ratio of various exit channels has been determined. However, questions remains still open about the values of the branching ratio measured for N{sub 2}O formation channel, as well as about the role of N{sub 2}(X,v) in the competition with N{sub 2}(A) for NO and NO{sub 2} formation. We are interested in N{sub 2}/O{sub 2} kinetics in rf pulsed discharge. In this contribution we present the measure by LIF of the decay of N{sub 2}(A,v=0) in a (0-20%)O{sub 2}-N{sub 2} mixture. We also monitor the behaviour of NO-{gamma} emission band which is expected to be correlated to some extent to the N{sub 2}(A) state decay by the processes: N{sub 2}(A,v) + O {r_arrow} NO(X) + N (1); N{sub 2}(A,v) + NO(X) {r_arrow} NO(A{sup 2}{summation}{sup +}) +N{sub 2} (2).
- OSTI ID:
- 226915
- Report Number(s):
- CONF-950749-; TRN: 96:001471-0052
- Resource Relation:
- Conference: 22. international conference on phenomena in ionized gases, Hoboken, NJ (United States), 31 Jul - 4 Aug 1995; Other Information: PBD: 1995; Related Information: Is Part Of XXII International conference on phenomena in ionized gases. Contributed papers 1; Becker, K.H.; Carr, W.E.; Kunhardt, E.E. [eds.]; PB: 172 p.
- Country of Publication:
- United States
- Language:
- English
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