On the ohmicity of Schottky contacts
Abstract
The conditions under which Schottky contacts become ohmic are analyzed. Proceeding from classical concepts of the mechanisms of current flow, a generalized Schottky contact model is investigated. This model takes into account the thermionic current of majority charge carriers and the recombination current of minority carriers in Schottky contacts with a dielectric gap. Based on an analysis of the predictions of this model, ohmicity criteria are obtained for Schottky contacts and the conditions for a low injection level and the ohmicity of Si-based Schottky contacts are compared. It is shown that the conditions for Schottky-contact ohmicity do not coincide with those for p–n junctions.
- Authors:
-
- National Academy of Sciences of Ukraine, Lashkaryov Institute of Semiconductor Physics (Ukraine)
- Publication Date:
- OSTI Identifier:
- 22645504
- Resource Type:
- Journal Article
- Journal Name:
- Semiconductors
- Additional Journal Information:
- Journal Volume: 50; Journal Issue: 6; Other Information: Copyright (c) 2016 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7826
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; CHARGE CARRIERS; COMPARATIVE EVALUATIONS; DIELECTRIC MATERIALS; ELECTRIC CURRENTS; P-N JUNCTIONS; RECOMBINATION; SCHOTTKY EFFECT; THERMIONICS
Citation Formats
Sachenko, A. V., E-mail: sach@isp.kiev.ua, Belyaev, A. E., and Konakova, R. V. On the ohmicity of Schottky contacts. United States: N. p., 2016.
Web. doi:10.1134/S106378261606021X.
Sachenko, A. V., E-mail: sach@isp.kiev.ua, Belyaev, A. E., & Konakova, R. V. On the ohmicity of Schottky contacts. United States. https://doi.org/10.1134/S106378261606021X
Sachenko, A. V., E-mail: sach@isp.kiev.ua, Belyaev, A. E., and Konakova, R. V. 2016.
"On the ohmicity of Schottky contacts". United States. https://doi.org/10.1134/S106378261606021X.
@article{osti_22645504,
title = {On the ohmicity of Schottky contacts},
author = {Sachenko, A. V., E-mail: sach@isp.kiev.ua and Belyaev, A. E. and Konakova, R. V.},
abstractNote = {The conditions under which Schottky contacts become ohmic are analyzed. Proceeding from classical concepts of the mechanisms of current flow, a generalized Schottky contact model is investigated. This model takes into account the thermionic current of majority charge carriers and the recombination current of minority carriers in Schottky contacts with a dielectric gap. Based on an analysis of the predictions of this model, ohmicity criteria are obtained for Schottky contacts and the conditions for a low injection level and the ohmicity of Si-based Schottky contacts are compared. It is shown that the conditions for Schottky-contact ohmicity do not coincide with those for p–n junctions.},
doi = {10.1134/S106378261606021X},
url = {https://www.osti.gov/biblio/22645504},
journal = {Semiconductors},
issn = {1063-7826},
number = 6,
volume = 50,
place = {United States},
year = {Wed Jun 15 00:00:00 EDT 2016},
month = {Wed Jun 15 00:00:00 EDT 2016}
}
Other availability
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.