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Title: Inelastic X-ray scattering with very high resolution at the ESRF

Abstract

The investigation of phonon dispersion in crystalline materials and collective atom motions in disordered matter such as liquids and glasses by inelastic X-ray scattering has attracted a diversified user community with the advent of 3{sup rd} generation synchrotron sources. The present article provides a short historical account of the research field and discusses selected highlights of research performed on the ESRF inelastic scattering beamlines ID16 and ID28 in the past ten years.

Authors:
;  [1]
  1. European Synchrotron Radiation Facility (France)
Publication Date:
OSTI Identifier:
22645269
Resource Type:
Journal Article
Resource Relation:
Journal Name: Crystallography Reports; Journal Volume: 62; Journal Issue: 1; Other Information: Copyright (c) 2017 Pleiades Publishing, Inc.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DISPERSIONS; EUROPEAN SYNCHROTRON RADIATION FACILITY; GLASS; INELASTIC SCATTERING; PHONONS; SYNCHROTRONS; X-RAY DIFFRACTION

Citation Formats

Krisch, M., E-mail: krisch@esrf.fr, and Sette, F.. Inelastic X-ray scattering with very high resolution at the ESRF. United States: N. p., 2017. Web. doi:10.1134/S1063774517010096.
Krisch, M., E-mail: krisch@esrf.fr, & Sette, F.. Inelastic X-ray scattering with very high resolution at the ESRF. United States. doi:10.1134/S1063774517010096.
Krisch, M., E-mail: krisch@esrf.fr, and Sette, F.. Sun . "Inelastic X-ray scattering with very high resolution at the ESRF". United States. doi:10.1134/S1063774517010096.
@article{osti_22645269,
title = {Inelastic X-ray scattering with very high resolution at the ESRF},
author = {Krisch, M., E-mail: krisch@esrf.fr and Sette, F.},
abstractNote = {The investigation of phonon dispersion in crystalline materials and collective atom motions in disordered matter such as liquids and glasses by inelastic X-ray scattering has attracted a diversified user community with the advent of 3{sup rd} generation synchrotron sources. The present article provides a short historical account of the research field and discusses selected highlights of research performed on the ESRF inelastic scattering beamlines ID16 and ID28 in the past ten years.},
doi = {10.1134/S1063774517010096},
journal = {Crystallography Reports},
number = 1,
volume = 62,
place = {United States},
year = {Sun Jan 15 00:00:00 EST 2017},
month = {Sun Jan 15 00:00:00 EST 2017}
}
  • We report on the progress in the development of new optics for very high resolution inelastic x-ray scattering spectroscopy. The principle of monochromatization and spectral analysis exploits the effect of angular dispersion in asymmetric Bragg diffraction in backscattering. It has a potential of monochromatizing medium-energy x-rays (5-10 keV) to meV and sub-meV bandwidths. We observe the effect of angular dispersion and study the performance of a CDW monochromator for 9.1 keV x-rays, based on this principle. The monochromator consists of three crystals playing the role of a collimator (C), a dispersing element (D), and a wavelength selector (W). Two CDWmore » monochromators, with the second one functioning as an analyzer, are used to measure the effect of monochromatization. An energy bandwidth of 2.2 meV for a single monochromator is demonstrated.« less
  • Inelastic X-ray scattering (IXS) is an important tool for studies of equilibrium dynamics in condensed matter. A new spectrometer recently proposed for ultra-high-resolution IXS (UHRIX) has achieved 0.6 meV and 0.25 nm -1spectral and momentum-transfer resolutions, respectively. However, further improvements down to 0.1 meV and 0.02 nm -1 are required to close the gap in energy–momentum space between high- and low-frequency probes. It is shown that this goal can be achieved by further optimizing the X-ray optics and by increasing the spectral flux of the incident X-ray pulses. UHRIX performs best at energies from 5 to 10 keV, where amore » combination of self-seeding and undulator tapering at the SASE-2 beamline of the European XFEL promises up to a 100-fold increase in average spectral flux compared with nominal SASE pulses at saturation, or three orders of magnitude more than what is possible with storage-ring-based radiation sources. Wave-optics calculations show that about 7 × 10 12 photons s -1 in a 90 µeV bandwidth can be achieved on the sample. This will provide unique new possibilities for dynamics studies by IXS.« less
  • Inelastic X-ray scattering (IXS) is an important tool for studies of equilibrium dynamics in condensed matter. A new spectrometer recently proposed for ultra-high-resolution IXS (UHRIX) has achieved 0.6 meV and 0.25 nm ₋1spectral and momentum-transfer resolutions, respectively. However, further improvements down to 0.1 meV and 0.02 nm ₋1are required to close the gap in energy–momentum space between high- and low-frequency probes. It is shown that this goal can be achieved by further optimizing the X-ray optics and by increasing the spectral flux of the incident X-ray pulses. UHRIX performs best at energies from 5 to 10 keV, where a combinationmore » of self-seeding and undulator tapering at the SASE-2 beamline of the European XFEL promises up to a 100-fold increase in average spectral flux compared with nominal SASE pulses at saturation, or three orders of magnitude more than what is possible with storage-ring-based radiation sources. Wave-optics calculations show that about 7 × 10 12 photons s ₋1in a 90 µeV bandwidth can be achieved on the sample. Ultimately, this will provide unique new possibilities for dynamics studies by IXS.« less
  • A nine-element analyzer system for inelastic X-ray scattering has been designed and constructed. Each individual analyzer crystal is carefully aligned with an inverse joystick goniometer. For the analyzers silicon wafers with 100 mm diameter are spherically bent to 1 or 0.85 m radius, respectively. Additionally, an analyzer with an extra small radius of 0.182 m and diameter of 100 mm was constructed for X-ray absorption spectroscopy in fluorescence mode. All analyzer crystals with large radius have highly uniform focusing property. The total energy resolution is approximately 0.5 eV at backscattering for the 1 m radius Si(440) analyzer array and approximatelymore » 4 eV for the 0.182 m radius Si(440) analyzer at 6493 eV.« less
  • Inelastic scattering of 6.5-keV x rays has been used to study the near-edge structure of the {beta}-rhombohedral boron {ital K} absorption edge. High resolution (better than 1 eV) combined with bright, intense synchrotron radiation makes it possible to probe the fine structure of the density of unoccupied electron states and compare results with the few existing band-structure calculations for solid boron.