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Title: Scanning nuclear electric resonance microscopy using quantum-Hall-effect breakdown

Abstract

We present a scanning nuclear-spin resonance (NSR) method that incorporates resistive detection with electric-field induced NSR locally excited by a scanning metallic probe. In the quantum-Hall effect breakdown regime, NSR intensity mapping at both the fundamental NSR frequency f{sub 75As} and twice the frequency 2f{sub 75As} demonstrates the capability to probe the distribution of nuclear polarization, particularly in a semiconductor quantum well. We find that f{sub 75As} NSR excitation drives not only local NSR but also spatially overlapped nonlocal NSR, which suppresses the maximum intensity of local NSR, while the 2f{sub 75As} NSR yields purely local excitation conferring a larger intensity.

Authors:
; ; ; ; ; ;  [1]
  1. Graduate School of Sciences, Tohoku University, Sendai 980-8578 (Japan)
Publication Date:
OSTI Identifier:
22611425
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 6; Journal Issue: 7; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BREAKDOWN; DETECTION; DISTRIBUTION; ELECTRIC FIELDS; ELECTRIC RESONANCE; EXCITATION; HALL EFFECT; MICROSCOPY; NUCLEAR MAGNETIC RESONANCE; POLARIZATION; QUANTUM WELLS; SEMICONDUCTOR MATERIALS; SPIN

Citation Formats

Hashimoto, K., E-mail: hashi@m.tohoku.ac.jp, Tomimatsu, T., Shirai, S., Taninaka, S., Nagase, K., Sato, K., and Hirayama, Y. Scanning nuclear electric resonance microscopy using quantum-Hall-effect breakdown. United States: N. p., 2016. Web. doi:10.1063/1.4960430.
Hashimoto, K., E-mail: hashi@m.tohoku.ac.jp, Tomimatsu, T., Shirai, S., Taninaka, S., Nagase, K., Sato, K., & Hirayama, Y. Scanning nuclear electric resonance microscopy using quantum-Hall-effect breakdown. United States. doi:10.1063/1.4960430.
Hashimoto, K., E-mail: hashi@m.tohoku.ac.jp, Tomimatsu, T., Shirai, S., Taninaka, S., Nagase, K., Sato, K., and Hirayama, Y. Fri . "Scanning nuclear electric resonance microscopy using quantum-Hall-effect breakdown". United States. doi:10.1063/1.4960430.
@article{osti_22611425,
title = {Scanning nuclear electric resonance microscopy using quantum-Hall-effect breakdown},
author = {Hashimoto, K., E-mail: hashi@m.tohoku.ac.jp and Tomimatsu, T. and Shirai, S. and Taninaka, S. and Nagase, K. and Sato, K. and Hirayama, Y.},
abstractNote = {We present a scanning nuclear-spin resonance (NSR) method that incorporates resistive detection with electric-field induced NSR locally excited by a scanning metallic probe. In the quantum-Hall effect breakdown regime, NSR intensity mapping at both the fundamental NSR frequency f{sub 75As} and twice the frequency 2f{sub 75As} demonstrates the capability to probe the distribution of nuclear polarization, particularly in a semiconductor quantum well. We find that f{sub 75As} NSR excitation drives not only local NSR but also spatially overlapped nonlocal NSR, which suppresses the maximum intensity of local NSR, while the 2f{sub 75As} NSR yields purely local excitation conferring a larger intensity.},
doi = {10.1063/1.4960430},
journal = {AIP Advances},
number = 7,
volume = 6,
place = {United States},
year = {Fri Jul 15 00:00:00 EDT 2016},
month = {Fri Jul 15 00:00:00 EDT 2016}
}