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Title: Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method

Abstract

Preparation of NiO thin films at different annealing temperature by sol-gel method was conducted to synthesize the quality of the surface thin films. The effects of annealing temperature on the surface topology were systematically investigated. Our studies confirmed that the surface roughness of the thin films was increased whenever annealing temperature was increase. NiO thin films morphology structure analysis was confirmed by field emission scanning electron microscope. Surface roughness of the thin films was investigated by atomic force microscopy.

Authors:
; ;  [1];  [2]; ;  [3];  [1];  [4]
  1. NANO-ElecTronic Centre (NET), Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor (Malaysia)
  2. NANO-SciTech Centre (NST), Institute of Science (IOS), Universiti Teknologi MARA - UiTM, 40450 Shah Alam, Selangor (Malaysia)
  3. Chair of Targeting and Treatment of Cancer Using Nanoparticles, Deanship of Scientific Research, King Saud University (KSU), Riyadh 11451 (Saudi Arabia)
  4. (NST), Institute of Science (IOS), Universiti Teknologi MARA - UiTM, 40450 Shah Alam, Selangor (Malaysia)
Publication Date:
OSTI Identifier:
22608580
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1733; Journal Issue: 1; Conference: IC-NET 2015: International conference on nano-electronic technology devices and materials 2015, Selangor (Malaysia), 27 Feb - 2 Mar 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANNEALING; ATOMIC FORCE MICROSCOPY; FIELD EMISSION; NICKEL; NICKEL OXIDES; ROUGHNESS; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SPIN; SPIN-ON COATING; SURFACES; THIN FILMS

Citation Formats

Abdullah, M. A. R., E-mail: ameerridhwan89@gmail.com, Mamat, M. H., E-mail: hafiz-030@yahoo.com, Ismail, A. S., E-mail: kyrin-samaxi@yahoo.com, Malek, M. F., E-mail: firz-solarzelle@yahoo.com, Alrokayan, Salman A. H., E-mail: dr.salman@alrokayan.com, Khan, Haseeb A., E-mail: khan-haseeb@yahoo.com, Rusop, M., E-mail: rusop@salam.uitm.my, and NANO-SciTech Centre. Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method. United States: N. p., 2016. Web. doi:10.1063/1.4948831.
Abdullah, M. A. R., E-mail: ameerridhwan89@gmail.com, Mamat, M. H., E-mail: hafiz-030@yahoo.com, Ismail, A. S., E-mail: kyrin-samaxi@yahoo.com, Malek, M. F., E-mail: firz-solarzelle@yahoo.com, Alrokayan, Salman A. H., E-mail: dr.salman@alrokayan.com, Khan, Haseeb A., E-mail: khan-haseeb@yahoo.com, Rusop, M., E-mail: rusop@salam.uitm.my, & NANO-SciTech Centre. Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method. United States. doi:10.1063/1.4948831.
Abdullah, M. A. R., E-mail: ameerridhwan89@gmail.com, Mamat, M. H., E-mail: hafiz-030@yahoo.com, Ismail, A. S., E-mail: kyrin-samaxi@yahoo.com, Malek, M. F., E-mail: firz-solarzelle@yahoo.com, Alrokayan, Salman A. H., E-mail: dr.salman@alrokayan.com, Khan, Haseeb A., E-mail: khan-haseeb@yahoo.com, Rusop, M., E-mail: rusop@salam.uitm.my, and NANO-SciTech Centre. Wed . "Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method". United States. doi:10.1063/1.4948831.
@article{osti_22608580,
title = {Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method},
author = {Abdullah, M. A. R., E-mail: ameerridhwan89@gmail.com and Mamat, M. H., E-mail: hafiz-030@yahoo.com and Ismail, A. S., E-mail: kyrin-samaxi@yahoo.com and Malek, M. F., E-mail: firz-solarzelle@yahoo.com and Alrokayan, Salman A. H., E-mail: dr.salman@alrokayan.com and Khan, Haseeb A., E-mail: khan-haseeb@yahoo.com and Rusop, M., E-mail: rusop@salam.uitm.my and NANO-SciTech Centre},
abstractNote = {Preparation of NiO thin films at different annealing temperature by sol-gel method was conducted to synthesize the quality of the surface thin films. The effects of annealing temperature on the surface topology were systematically investigated. Our studies confirmed that the surface roughness of the thin films was increased whenever annealing temperature was increase. NiO thin films morphology structure analysis was confirmed by field emission scanning electron microscope. Surface roughness of the thin films was investigated by atomic force microscopy.},
doi = {10.1063/1.4948831},
journal = {AIP Conference Proceedings},
number = 1,
volume = 1733,
place = {United States},
year = {Wed Jul 06 00:00:00 EDT 2016},
month = {Wed Jul 06 00:00:00 EDT 2016}
}