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Title: Development of the surface-sensitive soft x-ray absorption fine structure measurement technique for the bulk insulator

Abstract

We have succeeded in measuring X-ray absorption fine structure (TEY-XAFS) spectra of insulating plate samples by total electron yield. The biggest problem is how to suppress the charge-up. We have attempted to deposit a gold stripe electrode on the surface and obtained a TEY-XAFS spectrum. This indicates that the metal stripe electrode is very useful in the TEY-XAFS measurement of the insulating plate samples. In the detailed analysis, we have found that the effective area for suppressing charge-up was approximately 120 μm from the edge of the electrode.

Authors:
; ; ;  [1];  [2]
  1. Sumitomo Electric Industries, Ltd. Yokohama Works 1, Taya-cho, Sakae-ku, Yokohama 244-8588 (Japan)
  2. University of Hyogo. 3-1-2 Kouto Kamigoori-cho, Ako-gun, Hyogo 678-1205 (Japan)
Publication Date:
OSTI Identifier:
22608449
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1741; Journal Issue: 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION; ABSORPTION SPECTROSCOPY; APPROXIMATIONS; ELECTRONS; FINE STRUCTURE; GOLD; SOFT X RADIATION; SPECTRA; SURFACES; X-RAY SPECTROSCOPY

Citation Formats

Yonemura, Takumi, E-mail: yonemura-takumi@sei.co.jp, Iihara, Junji, Uemura, Shigeaki, Yamaguchi, Koji, and Niibe, Masahito, E-mail: niibe@lasti.u-hyogo.ac.jp. Development of the surface-sensitive soft x-ray absorption fine structure measurement technique for the bulk insulator. United States: N. p., 2016. Web. doi:10.1063/1.4952945.
Yonemura, Takumi, E-mail: yonemura-takumi@sei.co.jp, Iihara, Junji, Uemura, Shigeaki, Yamaguchi, Koji, & Niibe, Masahito, E-mail: niibe@lasti.u-hyogo.ac.jp. Development of the surface-sensitive soft x-ray absorption fine structure measurement technique for the bulk insulator. United States. doi:10.1063/1.4952945.
Yonemura, Takumi, E-mail: yonemura-takumi@sei.co.jp, Iihara, Junji, Uemura, Shigeaki, Yamaguchi, Koji, and Niibe, Masahito, E-mail: niibe@lasti.u-hyogo.ac.jp. 2016. "Development of the surface-sensitive soft x-ray absorption fine structure measurement technique for the bulk insulator". United States. doi:10.1063/1.4952945.
@article{osti_22608449,
title = {Development of the surface-sensitive soft x-ray absorption fine structure measurement technique for the bulk insulator},
author = {Yonemura, Takumi, E-mail: yonemura-takumi@sei.co.jp and Iihara, Junji and Uemura, Shigeaki and Yamaguchi, Koji and Niibe, Masahito, E-mail: niibe@lasti.u-hyogo.ac.jp},
abstractNote = {We have succeeded in measuring X-ray absorption fine structure (TEY-XAFS) spectra of insulating plate samples by total electron yield. The biggest problem is how to suppress the charge-up. We have attempted to deposit a gold stripe electrode on the surface and obtained a TEY-XAFS spectrum. This indicates that the metal stripe electrode is very useful in the TEY-XAFS measurement of the insulating plate samples. In the detailed analysis, we have found that the effective area for suppressing charge-up was approximately 120 μm from the edge of the electrode.},
doi = {10.1063/1.4952945},
journal = {AIP Conference Proceedings},
number = 1,
volume = 1741,
place = {United States},
year = 2016,
month = 7
}
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  • No abstract prepared.
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