skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source

Abstract

We report progress on implementation and commissioning of sequential X-ray diffraction topography at 1-BM Optics Testing Beamline of the Advanced Photon Source to accommodate growing needs of strain characterization in diffractive crystal optics and other semiconductor single crystals. The setup enables evaluation of strain in single crystals in the nearly-nondispersive double-crystal geometry. Si asymmetric collimator crystals of different crystallographic orientations were designed, fabricated and characterized using in-house capabilities. Imaging the exit beam using digital area detectors permits rapid sequential acquisition of X-ray topographs at different angular positions on the rocking curve of a crystal under investigation. Results on sensitivity and spatial resolution are reported based on experiments with high-quality Si and diamond crystals. The new setup complements laboratory-based X-ray topography capabilities of the Optics group at the Advanced Photon Source.

Authors:
; ; ; ; ; ; ; ; ; ;  [1]
  1. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)
Publication Date:
OSTI Identifier:
22608444
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1741; Journal Issue: 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ADVANCED PHOTON SOURCE; ASYMMETRY; BEAM OPTICS; COLLIMATORS; COMMISSIONING; CRYSTALLOGRAPHY; DESIGN; DIAMONDS; MONOCRYSTALS; NEUTRON DIFFRACTION; ORIENTATION; PHOTONS; SENSITIVITY; SPATIAL RESOLUTION; STRAINS; TOPOGRAPHY; X RADIATION; X-RAY DIFFRACTION

Citation Formats

Stoupin, Stanislav, E-mail: sstoupin@aps.anl.gov, Shvyd’ko, Yuri, Trakhtenberg, Emil, Liu, Zunping, Lang, Keenan, Huang, Xianrong, Wieczorek, Michael, Kasman, Elina, Hammonds, John, Macrander, Albert, and Assoufid, Lahsen. Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source. United States: N. p., 2016. Web. doi:10.1063/1.4952940.
Stoupin, Stanislav, E-mail: sstoupin@aps.anl.gov, Shvyd’ko, Yuri, Trakhtenberg, Emil, Liu, Zunping, Lang, Keenan, Huang, Xianrong, Wieczorek, Michael, Kasman, Elina, Hammonds, John, Macrander, Albert, & Assoufid, Lahsen. Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source. United States. doi:10.1063/1.4952940.
Stoupin, Stanislav, E-mail: sstoupin@aps.anl.gov, Shvyd’ko, Yuri, Trakhtenberg, Emil, Liu, Zunping, Lang, Keenan, Huang, Xianrong, Wieczorek, Michael, Kasman, Elina, Hammonds, John, Macrander, Albert, and Assoufid, Lahsen. Wed . "Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source". United States. doi:10.1063/1.4952940.
@article{osti_22608444,
title = {Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source},
author = {Stoupin, Stanislav, E-mail: sstoupin@aps.anl.gov and Shvyd’ko, Yuri and Trakhtenberg, Emil and Liu, Zunping and Lang, Keenan and Huang, Xianrong and Wieczorek, Michael and Kasman, Elina and Hammonds, John and Macrander, Albert and Assoufid, Lahsen},
abstractNote = {We report progress on implementation and commissioning of sequential X-ray diffraction topography at 1-BM Optics Testing Beamline of the Advanced Photon Source to accommodate growing needs of strain characterization in diffractive crystal optics and other semiconductor single crystals. The setup enables evaluation of strain in single crystals in the nearly-nondispersive double-crystal geometry. Si asymmetric collimator crystals of different crystallographic orientations were designed, fabricated and characterized using in-house capabilities. Imaging the exit beam using digital area detectors permits rapid sequential acquisition of X-ray topographs at different angular positions on the rocking curve of a crystal under investigation. Results on sensitivity and spatial resolution are reported based on experiments with high-quality Si and diamond crystals. The new setup complements laboratory-based X-ray topography capabilities of the Optics group at the Advanced Photon Source.},
doi = {10.1063/1.4952940},
journal = {AIP Conference Proceedings},
number = 1,
volume = 1741,
place = {United States},
year = {Wed Jul 27 00:00:00 EDT 2016},
month = {Wed Jul 27 00:00:00 EDT 2016}
}