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Title: Rietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample method

Abstract

Focused-beam flat-sample method (FFM) is a new trial for synchrotron powder diffraction method, which is a combination of beam focusing optics, flat shape powder sample and area detectors. The method has advantages for X-ray diffraction experiments applying anomalous scattering effect (anomalous diffraction), because of 1. Absorption correction without approximation, 2. High intensity X-rays of focused incident beams and high signal noise ratio of diffracted X-rays 3. Rapid data collection with area detectors. We applied the FFM to anomalous diffraction experiments and collected synchrotron X-ray powder diffraction data of CoFe{sub 2}O{sub 4} (inverse spinel structure) using X-rays near Fe K absorption edge, which can distinguish Co and Fe by anomalous scattering effect. We conducted Rietveld analyses with the obtained powder diffraction data and successfully determined the distribution of Co and Fe ions in CoFe{sub 2}O{sub 4} crystal structure.

Authors:
; ;  [1]
  1. Synchrotron X-ray Station at SPring-8, National Institute for Materials Science 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)
Publication Date:
OSTI Identifier:
22608443
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1741; Journal Issue: 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; APPROXIMATIONS; BEAM OPTICS; COBALT COMPOUNDS; COBALT OXIDES; CORRECTIONS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION METHODS; DISTRIBUTION; FERRITES; FOCUSING; IRON IONS; K ABSORPTION; POWDERS; SIGNAL-TO-NOISE RATIO; SPINELS; SYNCHROTRONS; X RADIATION; X-RAY DIFFRACTION

Citation Formats

Tanaka, Masahiko, E-mail: masahiko@spring8.or.jp, Katsuya, Yoshio, E-mail: katsuya@spring8.or.jp, and Sakata, Osami, E-mail: SAKATA.Osami@nims.go.jp. Rietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample method. United States: N. p., 2016. Web. doi:10.1063/1.4952939.
Tanaka, Masahiko, E-mail: masahiko@spring8.or.jp, Katsuya, Yoshio, E-mail: katsuya@spring8.or.jp, & Sakata, Osami, E-mail: SAKATA.Osami@nims.go.jp. Rietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample method. United States. doi:10.1063/1.4952939.
Tanaka, Masahiko, E-mail: masahiko@spring8.or.jp, Katsuya, Yoshio, E-mail: katsuya@spring8.or.jp, and Sakata, Osami, E-mail: SAKATA.Osami@nims.go.jp. 2016. "Rietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample method". United States. doi:10.1063/1.4952939.
@article{osti_22608443,
title = {Rietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample method},
author = {Tanaka, Masahiko, E-mail: masahiko@spring8.or.jp and Katsuya, Yoshio, E-mail: katsuya@spring8.or.jp and Sakata, Osami, E-mail: SAKATA.Osami@nims.go.jp},
abstractNote = {Focused-beam flat-sample method (FFM) is a new trial for synchrotron powder diffraction method, which is a combination of beam focusing optics, flat shape powder sample and area detectors. The method has advantages for X-ray diffraction experiments applying anomalous scattering effect (anomalous diffraction), because of 1. Absorption correction without approximation, 2. High intensity X-rays of focused incident beams and high signal noise ratio of diffracted X-rays 3. Rapid data collection with area detectors. We applied the FFM to anomalous diffraction experiments and collected synchrotron X-ray powder diffraction data of CoFe{sub 2}O{sub 4} (inverse spinel structure) using X-rays near Fe K absorption edge, which can distinguish Co and Fe by anomalous scattering effect. We conducted Rietveld analyses with the obtained powder diffraction data and successfully determined the distribution of Co and Fe ions in CoFe{sub 2}O{sub 4} crystal structure.},
doi = {10.1063/1.4952939},
journal = {AIP Conference Proceedings},
number = 1,
volume = 1741,
place = {United States},
year = 2016,
month = 7
}
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